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  • Absorption losses at a nanorough silver back reflector of a solar cell were measured with high accuracy by photothermal deflection spectroscopy. Roughness was characterized by atomic force microscopy. The observed increase of absorption, compared to the smooth silver, was explained by the surface plasmon absorption. Two series of silver back reflectors (one covered with thin ZnO layer) were investigated and their absorption related to surface morphology. Š2004 American Institute of Physics
  • Absorption losses at a nanorough silver back reflector of a solar cell were measured with high accuracy by photothermal deflection spectroscopy. Roughness was characterized by atomic force microscopy. The observed increase of absorption, compared to the smooth silver, was explained by the surface plasmon absorption. Two series of silver back reflectors (one covered with thin ZnO layer) were investigated and their absorption related to surface morphology. Š2004 American Institute of Physics (en)
  • Absorption losses at a nanorough silver back reflector of a solar cell were measured with high accuracy by photothermal deflection spectroscopy. Roughness was characterized by atomic force microscopy. The observed increase of absorption, compared to the smooth silver, was explained by the surface plasmon absorption. Two series of silver back reflectors (one covered with thin ZnO layer) were investigated and their absorption related to surface morphology. Š2004 American Institute of Physics (cs)
Title
  • Absorption loss at nanorough silver back reflector of thin-film silicon solar cells
  • Absorption loss at nanorough silver back reflector of thin-film silicon solar cells (en)
  • Absorption loss at nanorough silver back reflector of thin-film silicon solar cells (cs)
skos:prefLabel
  • Absorption loss at nanorough silver back reflector of thin-film silicon solar cells
  • Absorption loss at nanorough silver back reflector of thin-film silicon solar cells (en)
  • Absorption loss at nanorough silver back reflector of thin-film silicon solar cells (cs)
skos:notation
  • RIV/68407700:21340/04:04105318!RIV/2005/MSM/213405/N
http://linked.open.../vavai/riv/strany
  • 1427 ; 1429
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(SN/320/11/03), Z(MSM 210000021)
http://linked.open...iv/cisloPeriodika
  • 3
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
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http://linked.open...dnocenehoVysledku
  • 553314
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21340/04:04105318
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • absorptance; absorption; atomic force microscopy; back reflector; deflection spectroscopy; etching; reflectance; spectral region; surface (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [2BD3615D4059]
http://linked.open...i/riv/nazevZdroje
  • Journal of Applied Physics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 95
http://linked.open...iv/tvurceVysledku
  • Poruba, A.
  • Vaněček, M.
  • Hoďáková, Lenka
  • Rech, B.
  • Kluth, O.
  • Springer, J.
http://linked.open...n/vavai/riv/zamer
issn
  • 0021-8979
number of pages
http://localhost/t...ganizacniJednotka
  • 21340
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