About: Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure

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About: Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Fourier Transform Photocurrent Spectroscopy (FTPS) has been used for a fast and sensitive quality assessment of photovoltaic thin films, such as the microcrystalline silicon. Because the properties of this material strongly depend on the substrate used, we demonstrate here how to utilize the FTPS for measurement of films grown on conductive TCO covered glass substrate, as it is the case of solar cells. Further, we have studied homogeneity of the optoelectronic properties of layers over large areas (30x30 cm2) and for one case correlated the results with the cell efficiency over the area. Moreover, we show a possibility to interpret the FTPS data on cells as the quantum efficiency (spectral response) measurement and to extend the measuring range from near IR over the whole visible region. Fourier Transform Photocurrent Spectroscopy (FTPS) has been used for a fast and sensitive quality assessment of photovoltaic thin films, such as the microcrystalline silicon. Because the properties of this material strongly depend on the substrate used, we demonstrate here how to utilize the FTPS for measurement of films grown on conductive TCO covered glass substrate, as it is the case of solar cells. Further, we have studied homogeneity of the optoelectronic properties of layers over large areas (30x30 cm2) and for one case correlated the results with the cell efficiency over the area. Moreover, we show a possibility to interpret the FTPS data on cells as the quantum efficiency (spectral response) measurement and to extend the measuring range from near IR over the whole visible region. (en)
Title	Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure (en)
skos:prefLabel	Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure (en)
skos:notation	RIV/68407700:21340/03:04092499!RIV/2004/MSM/213404/N
http://linked.open.../vavai/riv/strany	146 ; 146
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM 210000022)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Müllerová, Lenka
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta jaderná a fyzikálně inženýrská
http://linked.open...dnocenehoVysledku	607094
http://linked.open...ai/riv/idVysledku	RIV/68407700:21340/03:04092499
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Fourier Transform Photocurrent Spectroscopy,transparent conductive oxide (en)
http://linked.open.../riv/klicoveSlovo	Fourier Transform Photocurrent Spectroscopy transparent conductive oxide
http://linked.open...ontrolniKodProRIV	[5A8EE0E39DA4]
http://linked.open...v/mistoKonaniAkce	Osaka
http://linked.open...i/riv/mistoVydani	Osaka
http://linked.open...i/riv/nazevZdroje	Abstract Book of the 3rd World Conference of Photovoltaic Energy Conversion
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	9 (xsd:int)
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Müllerová, Lenka Poruba, A. Vaněček, M. Shah, A. Wyrsch, N. Rech, B. Repmann, T. Špringer, J. Kundig, J.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2003-05-11 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20210000022
number of pages	1 (xsd:int)
http://purl.org/ne...btex#hasPublisher	ILE, Osaka University
http://localhost/t...ganizacniJednotka	21340

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