About: On test time reduction using pattern overlapping, broadcasting and on-chip decompression

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6219078&isnumber=6219000
Description	The paper deals with the problem of test data volume, test application time and on-chip test decompressor hardware overhead of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This new technique significantly reduces test application time by utilizing a new on-chip test decompressor architecture presented in this paper. The paper deals with the problem of test data volume, test application time and on-chip test decompressor hardware overhead of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This new technique significantly reduces test application time by utilizing a new on-chip test decompressor architecture presented in this paper. (en)
Title	On test time reduction using pattern overlapping, broadcasting and on-chip decompression On test time reduction using pattern overlapping, broadcasting and on-chip decompression (en)
skos:prefLabel	On test time reduction using pattern overlapping, broadcasting and on-chip decompression On test time reduction using pattern overlapping, broadcasting and on-chip decompression (en)
skos:notation	RIV/68407700:21240/12:00195640!RIV13-MSM-21240___
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(GA102/09/1668), S
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Chloupek, Martin Novák, Ondřej
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	156346
http://linked.open...ai/riv/idVysledku	RIV/68407700:21240/12:00195640
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Scan-based testing; broadcasting; on-chip decompression; overlapping; test compression (en)
http://linked.open.../riv/klicoveSlovo	test compression broadcasting Scan-based testing on-chip decompression overlapping
http://linked.open...ontrolniKodProRIV	[FEF8FD4F8D19]
http://linked.open...v/mistoKonaniAkce	Tallinn
http://linked.open...i/riv/mistoVydani	New York
http://linked.open...i/riv/nazevZdroje	Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	SoC circuits reliability and availability improvement
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Chloupek, Martin Jeníček, J. Novák, Ondřej
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2012-04-18 (xsd:date)
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/DDECS.2012.6219078
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society Press
https://schema.org/isbn	978-1-4673-1185-4
http://localhost/t...ganizacniJednotka	21240

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