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Description
  • This paper deals with a description of student's method, how to increase dependability (safety and reliability) of a system based on Field Programmable Gate Arrays (FPGAs). It discusses advantages of technology processes and structures of FPGAs. The paper describes differences between LUT-4 and LUT-6 in the Stuck-at fault model. My work is based and tested on the railway station safety device. This proposed electronic circuit is suitable to simulate single event upsets. In the end of the paper there are student's targets of future work and plans of testing proposed methods. These methods will be tested in real situations.
  • This paper deals with a description of student's method, how to increase dependability (safety and reliability) of a system based on Field Programmable Gate Arrays (FPGAs). It discusses advantages of technology processes and structures of FPGAs. The paper describes differences between LUT-4 and LUT-6 in the Stuck-at fault model. My work is based and tested on the railway station safety device. This proposed electronic circuit is suitable to simulate single event upsets. In the end of the paper there are student's targets of future work and plans of testing proposed methods. These methods will be tested in real situations. (en)
Title
  • Increasing Dependability by Fitting Circuit on FPGA
  • Increasing Dependability by Fitting Circuit on FPGA (en)
skos:prefLabel
  • Increasing Dependability by Fitting Circuit on FPGA
  • Increasing Dependability by Fitting Circuit on FPGA (en)
skos:notation
  • RIV/68407700:21240/11:00182615!RIV12-MSM-21240___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/09/1668), S, Z(MSM6840770014)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 204118
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21240/11:00182615
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • FPGA; Dependability; SEU; LUT; Technology Process (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [70F8D1EF2ECD]
http://linked.open...v/mistoKonaniAkce
  • Stará Lesná
http://linked.open...i/riv/mistoVydani
  • Bratislava
http://linked.open...i/riv/nazevZdroje
  • Počítačové architektury & diagnostika
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Vít, Pavel
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Slovenská technická univerzita v Bratislave
https://schema.org/isbn
  • 978-80-227-3552-0
http://localhost/t...ganizacniJednotka
  • 21240
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