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  • Unalloyed tin electroplating has a long history of whisker formation that has resulted in present reliability risks for electronic equipment. Tin whiskers can grow between adjacent conductors of different potential, causing transient or permanent electrical shorts. In addition, the whiskers can break loose, causing mechanical damage in slip rings, optical components or MEMS. The objective of our work is to investigate methods for tin whisker growth, which can further enable measuring the effectiveness of mitigation strategies.
  • Unalloyed tin electroplating has a long history of whisker formation that has resulted in present reliability risks for electronic equipment. Tin whiskers can grow between adjacent conductors of different potential, causing transient or permanent electrical shorts. In addition, the whiskers can break loose, causing mechanical damage in slip rings, optical components or MEMS. The objective of our work is to investigate methods for tin whisker growth, which can further enable measuring the effectiveness of mitigation strategies. (en)
Title
  • Methods of Accelerated Growth of Tin Whiskers
  • Methods of Accelerated Growth of Tin Whiskers (en)
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  • Methods of Accelerated Growth of Tin Whiskers
  • Methods of Accelerated Growth of Tin Whiskers (en)
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  • RIV/68407700:21230/12:00204810!RIV14-MSM-21230___
http://linked.open...avai/riv/aktivita
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  • 149774
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  • RIV/68407700:21230/12:00204810
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  • Tin Whiskers; Methodology; Test Method (en)
http://linked.open.../riv/klicoveSlovo
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  • [3E27661C9C68]
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  • Kudláček, Ivan
  • Žák, Pavel
  • Urbánek, Jan
http://localhost/t...ganizacniJednotka
  • 21230
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