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Description
  • The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will be presented.
  • The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will be presented. (en)
Title
  • ESD MOSFET model calibration by differential evolutionary optimization algorithm
  • ESD MOSFET model calibration by differential evolutionary optimization algorithm (en)
skos:prefLabel
  • ESD MOSFET model calibration by differential evolutionary optimization algorithm
  • ESD MOSFET model calibration by differential evolutionary optimization algorithm (en)
skos:notation
  • RIV/68407700:21230/12:00204620!RIV13-MSM-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • S
http://linked.open...iv/cisloPeriodika
  • 6
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 134723
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/12:00204620
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • ESD modeling; MOSFET; differential evolution; model calibration; curve fitting (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • CZ - Česká republika
http://linked.open...ontrolniKodProRIV
  • [B25C8966D179]
http://linked.open...i/riv/nazevZdroje
  • ElectroScope
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 2012
http://linked.open...iv/tvurceVysledku
  • Jakovenko, Jiří
  • Nápravník, Tomáš
issn
  • 1802-4564
number of pages
http://localhost/t...ganizacniJednotka
  • 21230
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