About: Measurement and Simulation of Coaxial to Microstrip Tansitions' Radiation Properties and Sbstrate Influence

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://www.radioeng.cz
Description	A radiation and electro-magnetic (EM) field analysis of coaxial-to-microstrip transitions is presented. Radiation is quantified by simulation and measurement of a crosstalk between two Omni-Spectra's transitions using microstrip 'open' calibration standards at different positions. Simulation results are compared to the measured data and good agreement is reported on two different substrates. The evaluation method which is used to analyze quality of the transition and its radiation properties was already developed and verified on a grounded coplanar waveguide (CPWG) transmission line. Results can be used to estimate uncertainty budget of the calibrated measurement with respect to the measured radiation. Results on different substrates show interesting behaviour and can prove useful when choosing suitable substrate for specific test-fixture. A radiation and electro-magnetic (EM) field analysis of coaxial-to-microstrip transitions is presented. Radiation is quantified by simulation and measurement of a crosstalk between two Omni-Spectra's transitions using microstrip 'open' calibration standards at different positions. Simulation results are compared to the measured data and good agreement is reported on two different substrates. The evaluation method which is used to analyze quality of the transition and its radiation properties was already developed and verified on a grounded coplanar waveguide (CPWG) transmission line. Results can be used to estimate uncertainty budget of the calibrated measurement with respect to the measured radiation. Results on different substrates show interesting behaviour and can prove useful when choosing suitable substrate for specific test-fixture. (en)
Title	Measurement and Simulation of Coaxial to Microstrip Tansitions' Radiation Properties and Sbstrate Influence Measurement and Simulation of Coaxial to Microstrip Tansitions' Radiation Properties and Sbstrate Influence (en)
skos:prefLabel	Measurement and Simulation of Coaxial to Microstrip Tansitions' Radiation Properties and Sbstrate Influence Measurement and Simulation of Coaxial to Microstrip Tansitions' Radiation Properties and Sbstrate Influence (en)
skos:notation	RIV/68407700:21230/12:00193022!RIV13-MSM-21230___
http://linked.open...avai/riv/aktivita	S
http://linked.open...avai/riv/aktivity	S
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Hoffmann, Karel Morávek, Ondřej
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	148841
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/12:00193022
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	microstrip; measurement standards; microwave measurement; microwave propagation; electromagnetic fields; radiation effects (en)
http://linked.open.../riv/klicoveSlovo	electromagnetic fields microwave propagation measurement standards microwave measurement radiation effects microstrip
http://linked.open...odStatuVydavatele	CZ - Česká republika
http://linked.open...ontrolniKodProRIV	[10B501C04D9B]
http://linked.open...i/riv/nazevZdroje	Radioengineering
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	21
http://linked.open...iv/tvurceVysledku	Hoffmann, Karel Morávek, Ondřej
http://linked.open...ain/vavai/riv/wos	000305713000005
issn	1210-2512
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	21230

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