About: Impact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor     Goto   Sponge   NotDistinct   Permalink

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  • We report on a piezoelectric response investigation of AlGaN/GaN circular high electron mobility transistor (C-HEMT) based ring gate capacitor as a new stress sensor device to be potentially applied for dynamic high-pressure sensing. A ring gate capacitor of C-HEMT with an additional ZnO gate interfacial layer was used to measure the changes in the piezoelectric charge induced directly by the variation of piezoelectric polarization of both gate piezoelectric layers (AlGaN, ZnO) for harmonic loading at different excitation frequences. Our experimental results show that about 10 nm thick piezoelectric ZnO layer grown on ring gate/AlGaN interface of C-HEMT can yield almost a 60% increase in the piezoelectric detection sensitivity of the device due to its higher piezoelectric coefficient.
  • We report on a piezoelectric response investigation of AlGaN/GaN circular high electron mobility transistor (C-HEMT) based ring gate capacitor as a new stress sensor device to be potentially applied for dynamic high-pressure sensing. A ring gate capacitor of C-HEMT with an additional ZnO gate interfacial layer was used to measure the changes in the piezoelectric charge induced directly by the variation of piezoelectric polarization of both gate piezoelectric layers (AlGaN, ZnO) for harmonic loading at different excitation frequences. Our experimental results show that about 10 nm thick piezoelectric ZnO layer grown on ring gate/AlGaN interface of C-HEMT can yield almost a 60% increase in the piezoelectric detection sensitivity of the device due to its higher piezoelectric coefficient. (en)
Title
  • Impact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor
  • Impact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor (en)
skos:prefLabel
  • Impact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor
  • Impact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor (en)
skos:notation
  • RIV/68407700:21230/11:00186056!RIV12-MV0-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/09/1601), P(VG20102015015)
http://linked.open...iv/cisloPeriodika
  • 172
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 203750
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/11:00186056
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • AlGaN/GaN; Circular-HEMT; Dynamical stress; Piezoelectric response; SiC; Stress sensor; ZnO (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [B5DDA85D60CC]
http://linked.open...i/riv/nazevZdroje
  • Sensors and Actuators
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 2011
http://linked.open...iv/tvurceVysledku
  • Držík, M.
  • Husák, Miroslav
  • Vanko, G.
  • Brunco, J.
  • Haščík, S.
  • Jakovenko, Jiří
  • Kutiš, V.
  • Lalinsky, T.
  • Rýger, I.
  • Vallo, M.
http://linked.open...ain/vavai/riv/wos
  • 000300026600005
issn
  • 0924-4247
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.sna.2011.09.028
http://localhost/t...ganizacniJednotka
  • 21230
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