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Description
| - Complex permittivity measurements are important in microwave engineering, material processing, as well as biomedical applications. Recently, planar circuits, such as microstrip lines, coplanar waveguides, and strip lines have found their applications in complex permittivity measurements. Planar structures, which are lightweight, compact and low cost, have been successfully applied to the determination of substrate permittivity, material moisture etc. Planar circuit measurements are classified into resonant methods (with high accuracy and sensitivity) and non-resonant methods (broadband measurements). When choosing the measurement method, we have to take into account the non-destructive form of measurement. Therefore the most appropriate method is a modified resonance method.
- Complex permittivity measurements are important in microwave engineering, material processing, as well as biomedical applications. Recently, planar circuits, such as microstrip lines, coplanar waveguides, and strip lines have found their applications in complex permittivity measurements. Planar structures, which are lightweight, compact and low cost, have been successfully applied to the determination of substrate permittivity, material moisture etc. Planar circuit measurements are classified into resonant methods (with high accuracy and sensitivity) and non-resonant methods (broadband measurements). When choosing the measurement method, we have to take into account the non-destructive form of measurement. Therefore the most appropriate method is a modified resonance method. (en)
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Title
| - Non-invasive Measurement of Complex Permittivity of Dielectric Substrates
- Non-invasive Measurement of Complex Permittivity of Dielectric Substrates (en)
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skos:prefLabel
| - Non-invasive Measurement of Complex Permittivity of Dielectric Substrates
- Non-invasive Measurement of Complex Permittivity of Dielectric Substrates (en)
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skos:notation
| - RIV/68407700:21230/11:00182328!RIV12-MSM-21230___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GAP102/11/0649), P(GD102/08/H081), S, Z(MSM6840770012)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21230/11:00182328
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - complex permittivity; non-invasive measurement; ring resonator (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Oppl, Ladislav
- Vrba, Jan
- Vorlíček, Jaroslav
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - České vysoké učení technické v Praze. Fakulta elektrotechnická
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https://schema.org/isbn
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http://localhost/t...ganizacniJednotka
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