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  • This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 kΩ up to 330 kΩ. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values.
  • This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 kΩ up to 330 kΩ. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values. (en)
Title
  • Measurement of Extreme Impedances
  • Measurement of Extreme Impedances (en)
skos:prefLabel
  • Measurement of Extreme Impedances
  • Measurement of Extreme Impedances (en)
skos:notation
  • RIV/68407700:21230/10:00167965!RIV11-GA0-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GD102/08/H027), Z(MSM6840770015)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 270009
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/10:00167965
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • calibration; impedance measurement; microwave circuits; microwave measurements; nanotechnology (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [63A8CF31FCE8]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • Proceedings of 15th Conference on Microwave Techniques COMITE 2010
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hoffmann, Karel
  • Randus, Martin
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav radioelektroniky
https://schema.org/isbn
  • 978-1-4244-6351-0
http://localhost/t...ganizacniJednotka
  • 21230
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