About: Tin Whiskers - Reliability Risk For Electronic Equipment

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Unalloyed tin electroplating has a long history of whisker formation that has resulted in reliability risks for electronic equipment. Tin whiskers can grow between adjacent conductors of different potential, causing transient or permanent electrical shorts. In addition, the whiskers can break loose, causing mechanical damage in slip rings, optical components or MEMS. Legislation restriction of lead in electronic products sold in the European Union and many other areas of the world has resulted in removing lead from Sn/Pb plating and solder. Using pure tin represents reliability risks due to whisker forming tendencies of tin. The objective of our work is to investigate methods for whisker growth, which can further enable measuring the effectiveness of mitigation strategies. To achieve this objective, a set of experiments was conducted using bright and matte tin platings on brass and bronze coupons and hot-solder dipped bronze coupons. Unalloyed tin electroplating has a long history of whisker formation that has resulted in reliability risks for electronic equipment. Tin whiskers can grow between adjacent conductors of different potential, causing transient or permanent electrical shorts. In addition, the whiskers can break loose, causing mechanical damage in slip rings, optical components or MEMS. Legislation restriction of lead in electronic products sold in the European Union and many other areas of the world has resulted in removing lead from Sn/Pb plating and solder. Using pure tin represents reliability risks due to whisker forming tendencies of tin. The objective of our work is to investigate methods for whisker growth, which can further enable measuring the effectiveness of mitigation strategies. To achieve this objective, a set of experiments was conducted using bright and matte tin platings on brass and bronze coupons and hot-solder dipped bronze coupons. (en)
Title	Tin Whiskers - Reliability Risk For Electronic Equipment Tin Whiskers - Reliability Risk For Electronic Equipment (en)
skos:prefLabel	Tin Whiskers - Reliability Risk For Electronic Equipment Tin Whiskers - Reliability Risk For Electronic Equipment (en)
skos:notation	RIV/68407700:21230/09:00157761!RIV10-MSM-21230___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(OE229)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Žák, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	346383
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/09:00157761
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Tin Whiskers; Reliability; Pure Tin (en)
http://linked.open.../riv/klicoveSlovo	Reliability Tin Whiskers Pure Tin
http://linked.open...ontrolniKodProRIV	[07309BCA9270]
http://linked.open...v/mistoKonaniAkce	Stutensee-Blankenloch (Karlsruhe)
http://linked.open...i/riv/mistoVydani	Pfinztal (Berghausen)
http://linked.open...i/riv/nazevZdroje	Umwelteinflüsse erfassen, simulieren, bewerten
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Bestproduct -Teeneest Through a European network on Environmental Engineering Sciences and Technologies
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Žák, Pavel
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-03-18 (xsd:date)
number of pages	13 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Gesellschaft für Umweltsimulation e.V.
https://schema.org/isbn	978-3-9810472-7-1
http://localhost/t...ganizacniJednotka	21230

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