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Description
  • V příspěvku je uveden rychlý test nejlépe proloženou sinusovkou v zabudovaných AD systémech. Jsou analyzovány vlastnosti metody z hlediska přesnosti a časové náročnosti. Test je užit k určení závislosti efektivního počtu bitů na kmitočtu sinusového signálu. Metoda je vhodná k testování parametrů systémů v průmyslové praxi, neboť vykazuje výraznou časovou úsporu. (cs)
  • A short sine wave fit test method for embedded ADC systems is investigated. Common testing methods are mentioned as far as the accuracy and time necessary for the complete test are concerned. A wobbler test for fast evaluation of the dependence of an effective number of bits on frequency of input signal is described and the comparison of proposed method with the standard methods is given. The suitable area of proposed method application is %22each-piece%22 factory testing requiring extremely short testing time.
  • A short sine wave fit test method for embedded ADC systems is investigated. Common testing methods are mentioned as far as the accuracy and time necessary for the complete test are concerned. A wobbler test for fast evaluation of the dependence of an effective number of bits on frequency of input signal is described and the comparison of proposed method with the standard methods is given. The suitable area of proposed method application is %22each-piece%22 factory testing requiring extremely short testing time. (en)
Title
  • Implementation of ADC Wobbler Test in FPGA
  • Implementation of ADC Wobbler Test in FPGA (en)
  • Použití rozmítacího testu v FPGA obvodech (cs)
skos:prefLabel
  • Implementation of ADC Wobbler Test in FPGA
  • Implementation of ADC Wobbler Test in FPGA (en)
  • Použití rozmítacího testu v FPGA obvodech (cs)
skos:notation
  • RIV/68407700:21230/08:03148208!RIV09-MSM-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM6840770015)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 371617
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/08:03148208
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • ADC test; effective number of bits; wobbler test (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [A76CE51EB4FF]
http://linked.open...v/mistoKonaniAkce
  • Grenoble
http://linked.open...i/riv/mistoVydani
  • Grenoble
http://linked.open...i/riv/nazevZdroje
  • DCIS 2008 - Conference on Design of Circuits and Integrated Systems
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Vedral, Josef
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • TIMA
https://schema.org/isbn
  • 978-2-84813-124-5
http://localhost/t...ganizacniJednotka
  • 21230
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