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Description
  • Article deals with the mechanical stress and the temperature aging of the lead and lead free soldered joints. Mechanical stress and temperature aging can change electrical properties of the soldered joints, e.g. electrical resistance. In this article, the changes of the electrical resistance of mechanically stressed and temperature aged soldered joints (lead Sn62Pb36Ag2 and lead free Sn95.5Ag4Cu0.5) are compared.
  • Article deals with the mechanical stress and the temperature aging of the lead and lead free soldered joints. Mechanical stress and temperature aging can change electrical properties of the soldered joints, e.g. electrical resistance. In this article, the changes of the electrical resistance of mechanically stressed and temperature aged soldered joints (lead Sn62Pb36Ag2 and lead free Sn95.5Ag4Cu0.5) are compared. (en)
Title
  • Influence of Mechanical Stress and Temperature Aging on a Change of Electrical Connection Resistance
  • Influence of Mechanical Stress and Temperature Aging on a Change of Electrical Connection Resistance (en)
skos:prefLabel
  • Influence of Mechanical Stress and Temperature Aging on a Change of Electrical Connection Resistance
  • Influence of Mechanical Stress and Temperature Aging on a Change of Electrical Connection Resistance (en)
skos:notation
  • RIV/68407700:21230/08:00147969!RIV11-MSM-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM6840770021)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 372178
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/08:00147969
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • mechanical stress; temperature aging; solder joints (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [016E6DCC109E]
http://linked.open...v/mistoKonaniAkce
  • Budapest
http://linked.open...i/riv/mistoVydani
  • New York
http://linked.open...i/riv/nazevZdroje
  • 31st International Spring Seminar on Electronics Technology
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Dušek, Karel
  • Tučan, Marek
http://linked.open...vavai/riv/typAkce
http://linked.open...ain/vavai/riv/wos
  • 000272337900010
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE
https://schema.org/isbn
  • 978-1-4244-3973-7
http://localhost/t...ganizacniJednotka
  • 21230
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