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  • ADC testing frequently confronts the problem of spectral purity of harmonic test signal. The majority of dynamic ADC test methods require test signal distortion at least 10 dB less than that of the tested ADC - the condition that cannot be practically fulfilled for testing up-to-date ADCs. More sophisticated approach to ADC testing applies the correction for test signal imperfections. In both cases test signal distortion has to be known - roughly in the first case and quite accurately in the second case. In this paper an easy method for the testing of signal spectral purity is proposed. Test signal passed by one of two simple analog filters is measured by a common ADC, whose nonlinearity is mathematically post-corrected. The results are compared with common approach applying notch filter and uncertainty analysis is performed.
  • ADC testing frequently confronts the problem of spectral purity of harmonic test signal. The majority of dynamic ADC test methods require test signal distortion at least 10 dB less than that of the tested ADC - the condition that cannot be practically fulfilled for testing up-to-date ADCs. More sophisticated approach to ADC testing applies the correction for test signal imperfections. In both cases test signal distortion has to be known - roughly in the first case and quite accurately in the second case. In this paper an easy method for the testing of signal spectral purity is proposed. Test signal passed by one of two simple analog filters is measured by a common ADC, whose nonlinearity is mathematically post-corrected. The results are compared with common approach applying notch filter and uncertainty analysis is performed. (en)
Title
  • Easy Estimation of Spectral Purity of Test Signals for ADC Testing
  • Easy Estimation of Spectral Purity of Test Signals for ADC Testing (en)
skos:prefLabel
  • Easy Estimation of Spectral Purity of Test Signals for ADC Testing
  • Easy Estimation of Spectral Purity of Test Signals for ADC Testing (en)
skos:notation
  • RIV/68407700:21230/08:00146103!RIV11-MSM-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM6840770015)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
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  • 364777
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/08:00146103
http://linked.open...riv/jazykVysledku
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  • ADC testing; frequency spectrum correction; sine wave signal; uncertainty (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [20FA10A09FB2]
http://linked.open...v/mistoKonaniAkce
  • Florence
http://linked.open...i/riv/mistoVydani
  • Florence
http://linked.open...i/riv/nazevZdroje
  • 13th Workshop on ADC Modelling and Testing
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Slepička, David
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • University of Florence
https://schema.org/isbn
  • 978-88-903149-3-3
http://localhost/t...ganizacniJednotka
  • 21230
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