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| Description
| - This paper deals with reflectivity of a gold layer of nanometer-scale thickness sputtered on a dielectric foil at microwave frequencies. A model of nanometer-scale spheres characterizes the behavior of the layer. For short sputtering times, these spheres are separated, and later they touch each other to form a continuous layer. The structure > is analyzed in several ways. The first model, as suggested in the literature, replaces the spheres by their electric dipole moments, while the second, newly proposed model replaces them by their mutual capacities. The structure is also being investigated by the CST Microwave Studio software. The data provided by the models is compared with the data obtained from measurements published previously. The reduction in effective conductivity of the layer due to microscopic phenomena in thin films is taken into account in the models. The measured conductivity is compared with values taken from the literature, and the differences are discussed.
- This paper deals with reflectivity of a gold layer of nanometer-scale thickness sputtered on a dielectric foil at microwave frequencies. A model of nanometer-scale spheres characterizes the behavior of the layer. For short sputtering times, these spheres are separated, and later they touch each other to form a continuous layer. The structure > is analyzed in several ways. The first model, as suggested in the literature, replaces the spheres by their electric dipole moments, while the second, newly proposed model replaces them by their mutual capacities. The structure is also being investigated by the CST Microwave Studio software. The data provided by the models is compared with the data obtained from measurements published previously. The reduction in effective conductivity of the layer due to microscopic phenomena in thin films is taken into account in the models. The measured conductivity is compared with values taken from the literature, and the differences are discussed. (en)
- Článek se zabývá mikrovlnným odrazem od zlaté vrstvy nanometrové tloušťky naprášené na dielektrické fólii. Vrstva je charakterizována modelem sestávajícím z kuliček o velikosti řádu nanometrů. Pro krátké doby naprašování jsou kuličky oddělené, později se dotýkají a tvoří souvislou vrstvu. Struktura je vyšetřována několika způsoby. První model převzatý z literatury nahrazuje kuličky jejich elektrickým dipólovým momentem, zatímco druhý, nově navržený model je nahrazuje vzájemnými kapacitami. Struktura je také analyzována programem CST Microwave Studio. Data získaná modely jsou srovnána s dříve publikovanými naměřenými daty. Modely rovněž berou v úvahu pokles efektivní vodivosti způsobený mikroskopickými jevy odehrávajícími se v tenkých vrstvách. Měřená vodivost je porovnána s hodnotami z literatury a rozdíly jsou komentovány. (cs)
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| Title
| - Microwave Reflectivity From Gold Sputtered Nanolayer
- Microwave Reflectivity From Gold Sputtered Nanolayer (en)
- Odraz mikrovln od zlaté naprášené nano-vrstvy (cs)
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| skos:prefLabel
| - Microwave Reflectivity From Gold Sputtered Nanolayer
- Microwave Reflectivity From Gold Sputtered Nanolayer (en)
- Odraz mikrovln od zlaté naprášené nano-vrstvy (cs)
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| skos:notation
| - RIV/68407700:21230/07:03135030!RIV08-GA0-21230___
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| http://linked.open.../vavai/riv/strany
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
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| http://linked.open...iv/cisloPeriodika
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21230/07:03135030
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - coefficient; conductivity; nanoparticle; polarisability; thin layer (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...i/riv/nazevZdroje
| - IEEE Transactions on Nanotechnology
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| http://linked.open...in/vavai/riv/obor
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| http://linked.open...ichTvurcuVysledku
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| http://linked.open...cetTvurcuVysledku
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| http://linked.open...vavai/riv/projekt
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| http://linked.open...UplatneniVysledku
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| http://linked.open...v/svazekPeriodika
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| http://linked.open...iv/tvurceVysledku
| - Macháč, Jan
- Zehentner, Ján
- Buchar, Pavel
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| issn
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| number of pages
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| http://localhost/t...ganizacniJednotka
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