About: Modeling of Evaporation of Thin Films Using DOE

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Technology of factorial experiments is used for simulation of evaporation of thin Ni films. Evaporated structures were examined from the point of view of the resistance and their thickness. Technology of factorial experiments is used for simulation of evaporation of thin Ni films. Evaporated structures were examined from the point of view of the resistance and their thickness. (en)
Title	Modeling of Evaporation of Thin Films Using DOE Modeling of Evaporation of Thin Films Using DOE (en)
skos:prefLabel	Modeling of Evaporation of Thin Films Using DOE Modeling of Evaporation of Thin Films Using DOE (en)
skos:notation	RIV/68407700:21230/06:00167865!RIV11-MSM-21230___
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM6840770021)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Mach, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	486160
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/06:00167865
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Evaporation; DOE; Thickness (en)
http://linked.open.../riv/klicoveSlovo	Evaporation DOE Thickness
http://linked.open...ontrolniKodProRIV	[8CAD58F9D420]
http://linked.open...v/mistoKonaniAkce	St. Marienthal
http://linked.open...i/riv/mistoVydani	New York
http://linked.open...i/riv/nazevZdroje	29th International Spring Seminar on Electronics Technology
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2006
http://linked.open...iv/tvurceVysledku	Mach, Pavel Kocián, M.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000246825800045
http://linked.open.../riv/zahajeniAkce	2006-05-10 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Characterization of materials
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IEEE
https://schema.org/isbn	978-1-4244-0550-3
http://localhost/t...ganizacniJednotka	21230

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