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  • The development of integrated circuits has reached a situation today that the circuit operating speed is not limited by the parameters of the transistors any more, but rather by the electrical parameters of the interconnections inside the integrated circuit. For this reason, it is necessary to take in account the properties of interconnecting conductors from the start of the circuit design process. Undesirable parasitic electromagnetic couplings appear between the interconnecting lines, causing the transfer of interfering impulses onto the signal-carrying lines. These interfering impulses then result in random errors and/or disturbances in the integrated circuit. In order to be able to solve the problem of electromagnetic couplings inside integrated circuits, it is imperative to be able to determine the electrical parameters of the interconnecting girds as accurately as possible.
  • The development of integrated circuits has reached a situation today that the circuit operating speed is not limited by the parameters of the transistors any more, but rather by the electrical parameters of the interconnections inside the integrated circuit. For this reason, it is necessary to take in account the properties of interconnecting conductors from the start of the circuit design process. Undesirable parasitic electromagnetic couplings appear between the interconnecting lines, causing the transfer of interfering impulses onto the signal-carrying lines. These interfering impulses then result in random errors and/or disturbances in the integrated circuit. In order to be able to solve the problem of electromagnetic couplings inside integrated circuits, it is imperative to be able to determine the electrical parameters of the interconnecting girds as accurately as possible. (en)
Title
  • Numerical Analysis of Electromagnetic Fields in Interconnecting Grids
  • Numerical Analysis of Electromagnetic Fields in Interconnecting Grids (en)
skos:prefLabel
  • Numerical Analysis of Electromagnetic Fields in Interconnecting Grids
  • Numerical Analysis of Electromagnetic Fields in Interconnecting Grids (en)
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  • RIV/68407700:21230/06:00123331!RIV11-MSM-21230___
http://linked.open...avai/riv/aktivita
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  • Z(MSM6840770012)
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  • 489292
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  • RIV/68407700:21230/06:00123331
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  • coupling capacities; integrated circuit; simulation (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [1750A7F60E4A]
http://linked.open...v/mistoKonaniAkce
  • Praha
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  • Athens
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  • Proceedings of the WSEAS International Conference: 5th WSEAS Int.Conf. on MICROELECTRONICS, NANOELECTRONICS, OPTOELECTRONICS (MINO'06)
http://linked.open...in/vavai/riv/obor
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http://linked.open...UplatneniVysledku
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  • Foit, Julius
  • Janíček, Vladimír
  • Novák, Jan
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
issn
  • 1790-5117
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  • WSEAS Press
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  • 960-8457-42-4
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  • 21230
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