About: Reliability of Reverse Properties of Power Semiconductor Devices

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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Description	Reliability of reverse properties of power semiconductor devices is an important condition for their practical applications. Reliability of reverse properties of power semiconductor devices is an important condition for their practical applications. (en)
Title	Reliability of Reverse Properties of Power Semiconductor Devices Reliability of Reverse Properties of Power Semiconductor Devices (en)
skos:prefLabel	Reliability of Reverse Properties of Power Semiconductor Devices Reliability of Reverse Properties of Power Semiconductor Devices (en)
skos:notation	RIV/68407700:21230/06:00120372!RIV10-MSM-21230___
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http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Papež, Václav Šámal, David
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
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issn	1751-858X
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