About: System for Testing Middle-Resolution Digitizers Using Test Signal up to 20 MHz     Goto   Sponge   NotDistinct   Permalink

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Description
  • In the last years, universal measurement setup for high-resolution ADC testing at the frequency of 1 MHz was designed and prototyped at the Dept. of Measurement, CTU FEE. The experience and good measurement results initiated the extension of the system frequency range up to 20 MHz. In this paper, the extended measurement setup is introduced in two versions: low-cost version enabling the testing of 11-13 bit ADCs and high-quality version for the evaluation of even 20 bit ADCs.
  • In the last years, universal measurement setup for high-resolution ADC testing at the frequency of 1 MHz was designed and prototyped at the Dept. of Measurement, CTU FEE. The experience and good measurement results initiated the extension of the system frequency range up to 20 MHz. In this paper, the extended measurement setup is introduced in two versions: low-cost version enabling the testing of 11-13 bit ADCs and high-quality version for the evaluation of even 20 bit ADCs. (en)
Title
  • System for Testing Middle-Resolution Digitizers Using Test Signal up to 20 MHz
  • System for Testing Middle-Resolution Digitizers Using Test Signal up to 20 MHz (en)
skos:prefLabel
  • System for Testing Middle-Resolution Digitizers Using Test Signal up to 20 MHz
  • System for Testing Middle-Resolution Digitizers Using Test Signal up to 20 MHz (en)
skos:notation
  • RIV/68407700:21230/06:00120274!RIV11-GA0-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GD102/05/H032), Z(MSM6840770015)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 502883
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/06:00120274
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • high-resolution ADC testing; testing (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [31E7DD2A3DFA]
http://linked.open...v/mistoKonaniAkce
  • Sorrento
http://linked.open...i/riv/mistoVydani
  • Sorrento
http://linked.open...i/riv/nazevZdroje
  • IMTC/06 Proceedings of the 23rd IEEE Instrumentation and Measurement Technology Conference
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Slepička, David
  • Suchánek, Petr
  • Roztočil, Jaroslav
  • Haasz, Vladimír
  • Komárek, Milan
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE
https://schema.org/isbn
  • 0-7803-9360-0
http://localhost/t...ganizacniJednotka
  • 21230
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