About: Pseudorandom Testability - Study of the Effect of the Generator Type

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Není k dispozici (cs) During a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. We discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases a linear feedback shift register (LFSR) is used as a test pattern generator, while its generating polynomial is primitive to ensure a maximal period. We show that it is not necessary to use primitive polynomials, and moreover that their using is even undesirable in most cases. The observations are documented by statistical results. During a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. We discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases a linear feedback shift register (LFSR) is used as a test pattern generator, while its generating polynomial is primitive to ensure a maximal period. We show that it is not necessary to use primitive polynomials, and moreover that their using is even undesirable in most cases. The observations are documented by statistical results. (en)
Title	Pseudorandom Testability - Study of the Effect of the Generator Type Není k dispozici (cs) Pseudorandom Testability - Study of the Effect of the Generator Type (en)
skos:prefLabel	Pseudorandom Testability - Study of the Effect of the Generator Type Není k dispozici (cs) Pseudorandom Testability - Study of the Effect of the Generator Type (en)
skos:notation	RIV/68407700:21230/05:03109961!RIV06-GA0-21230___
http://linked.open.../vavai/riv/strany	47 ; 54
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/04/2137), Z(MSM6840770014)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Kubátová, Hana Fišer, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	539587
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/05:03109961
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	buitl-in self-test, diagnostics, testability, LFSR, test-pattern generator, column matching (en)
http://linked.open.../riv/klicoveSlovo	testability diagnostics LFSR buitl-in self-test column matching test-pattern generator
http://linked.open...odStatuVydavatele	CZ - Česká republika
http://linked.open...ontrolniKodProRIV	[A772FAE3C635]
http://linked.open...i/riv/nazevZdroje	Acta Polytechnica
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Design of highly reliable control systems built on dynamically reconfigurable FPGAs.
http://linked.open...UplatneniVysledku	2005
http://linked.open...v/svazekPeriodika	45
http://linked.open...iv/tvurceVysledku	Kubátová, Hana Fišer, Petr
http://linked.open...n/vavai/riv/zamer	Výzkum perspektivních informačních a komunikačních technologií
issn	1210-2709
number of pages	8 (xsd:int)
http://localhost/t...ganizacniJednotka	21230

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