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Description
  • Není k dispozici (cs)
  • This paper focuses on a fault classification problem for concurrent error detection circuits based on error detecting codes. The proposed fault classification differs from the common classification, where the faults are divided into two groups - the testable faults and the untestable faults. The faults are divided into four groups in our approach, by their impact to fault secure and self-testing properties. Our fault simulation software has been used to evaluate the proposed fault classification on real benchmarks. The benchmarks were implemented in a FPGA, and stuck-at-1 and stuck-at-0 fault model has been considered.
  • This paper focuses on a fault classification problem for concurrent error detection circuits based on error detecting codes. The proposed fault classification differs from the common classification, where the faults are divided into two groups - the testable faults and the untestable faults. The faults are divided into four groups in our approach, by their impact to fault secure and self-testing properties. Our fault simulation software has been used to evaluate the proposed fault classification on real benchmarks. The benchmarks were implemented in a FPGA, and stuck-at-1 and stuck-at-0 fault model has been considered. (en)
Title
  • Fault Classification for Self-checking Circuits Implemented in FPGA
  • Není k dispozici (cs)
  • Fault Classification for Self-checking Circuits Implemented in FPGA (en)
skos:prefLabel
  • Fault Classification for Self-checking Circuits Implemented in FPGA
  • Není k dispozici (cs)
  • Fault Classification for Self-checking Circuits Implemented in FPGA (en)
skos:notation
  • RIV/68407700:21230/05:03108032!RIV06-GA0-21230___
http://linked.open.../vavai/riv/strany
  • 228 ; 231
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/04/2137), Z(MSM6840770014)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 521445
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/05:03108032
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • fault security, self-testing, fault tolerant,, digital design. testing, FPGA (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [D7866F3DC291]
http://linked.open...v/mistoKonaniAkce
  • Sopron
http://linked.open...i/riv/mistoVydani
  • Sopron
http://linked.open...i/riv/nazevZdroje
  • Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Kafka, Leoš
  • Novák, Ondřej
  • Kubátová, Hana
  • Kubalík, Pavel
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • University of Western Hungary
https://schema.org/isbn
  • 963-9364-48-7
http://localhost/t...ganizacniJednotka
  • 21230
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