About: Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Není k dispozici (cs) In this paper we present a discussion on choosing the test lengths in our mixed-mode BIST technique. The BIST design method is based on the column-matching algorithm proposed before. The mixed-mode strategy divides the test sequence into two disjoint phases: first the pseudo random phase detects the easy-to-detect faults, and the subsequent deterministic phase generates test vectors needed to fully test the circuit. The lengths of these two phases directly influence both the test time and the BIST area overhead, as well as the BIST design time. Some kind of trade-off has to be found, to design the BIST circuitry efficiently. The pseudo-random testability of the ISCAS benchmarks is studied here. The conclusions obtained here can be generalized to be applied to any circuit. In this paper we present a discussion on choosing the test lengths in our mixed-mode BIST technique. The BIST design method is based on the column-matching algorithm proposed before. The mixed-mode strategy divides the test sequence into two disjoint phases: first the pseudo random phase detects the easy-to-detect faults, and the subsequent deterministic phase generates test vectors needed to fully test the circuit. The lengths of these two phases directly influence both the test time and the BIST area overhead, as well as the BIST design time. Some kind of trade-off has to be found, to design the BIST circuitry efficiently. The pseudo-random testability of the ISCAS benchmarks is studied here. The conclusions obtained here can be generalized to be applied to any circuit. (en)
Title	Není k dispozici (cs) Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST (en)
skos:prefLabel	Není k dispozici (cs) Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST (en)
skos:notation	RIV/68407700:21230/04:03100099!RIV/2005/GA0/212305/N
http://linked.open.../vavai/riv/strany	201 ; 204
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/04/2137), Z(MSM 212300014)
http://linked.open...vai/riv/dodaniDat	2005
http://linked.open...aciTvurceVysledku	Kubátová, Hana Fišer, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	568059
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/04:03100099
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	digital testing, mixed-mode BIST, test length, area overhead (en)
http://linked.open.../riv/klicoveSlovo	area overhead digital testing mixed-mode BIST test length
http://linked.open...ontrolniKodProRIV	[9EB4679DECA6]
http://linked.open...v/mistoKonaniAkce	Tallinn
http://linked.open...i/riv/mistoVydani	Tallinn
http://linked.open...i/riv/nazevZdroje	Proceedings of the 9th Biennial Baltic Electronics Conference
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Design of highly reliable control systems built on dynamically reconfigurable FPGAs.
http://linked.open...UplatneniVysledku	2004
http://linked.open...iv/tvurceVysledku	Kubátová, Hana Fišer, Petr
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2004-10-03 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20212300014
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Tallinn Technical University
https://schema.org/isbn	9985-59-462-2
http://localhost/t...ganizacniJednotka	21230

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 24 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software