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  • DLTS is one of several methods for detecting and characterizing deep levels in semiconductors. Its major strength is that it is spectroscopic, i.e. it gives a unique line or peak for each deep level detected, in a way which makes it quick and easy to relate the spectrum to the concentration and energy of each defect - at least in quantitative sense. Quantitative information is obtained from the spectra with a small amount of analysis and the signatures of common defects.
  • DLTS is one of several methods for detecting and characterizing deep levels in semiconductors. Its major strength is that it is spectroscopic, i.e. it gives a unique line or peak for each deep level detected, in a way which makes it quick and easy to relate the spectrum to the concentration and energy of each defect - at least in quantitative sense. Quantitative information is obtained from the spectra with a small amount of analysis and the signatures of common defects. (en)
Title
  • DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons
  • DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons (en)
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  • DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons
  • DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons (en)
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  • RIV/68407700:21220/11:00189607!RIV12-MSM-21220___
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  • Z(MSM6840770029)
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  • 195084
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  • RIV/68407700:21220/11:00189607
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  • DLTS Measurement; Silicon Detector; Neutrons Damaged (en)
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  • [53886F52A13C]
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  • Nový Smokovec
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  • Žilina
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  • Proceedings of the 17th International Conference on Applied Physics of Condensed Matter
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  • Chren, Dominik
  • Kohout, Zdeněk
  • Sopko, Bruno
  • Vlk, Josef
  • Dammer, Jiří
  • Sopko, Vít
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  • Žilinská univerzita v Žiline
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  • 978-80-554-0386-1
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  • 21220
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