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  • Nanotechnologie pronikají již do všech oblastí průmyslového světa, výjimkou není ani strojírenství. Vzniká však otázka, jak tyto nanotechnologie prakticky využít, a zda vůbec budou tyto nanorozměry měřitelné. Pozornost si zasluhuje i změna fyzikálních vlastností povrchu, na kterém jsou nanovrstvy. Nanovrstva na povrchu umožňuje, při vzájemném kontaktu dvou povrchů, snížit činitel tření. Tohoto se dá s úspěchem využít v metrologii. Ocelové dotyky měřidel, např. číselníkového úchylkoměru, které budou opatřené nanovrstvou, sníží nejistotu měření. (cs)
  • Now, verification of surface structure was carried out experimentally only: application nano-layer on surface of the steel stylus of the dial gauge. The principle of verification was based on a hypothetical premise of measurement of a friction coefficient. The experiment showed nano-layer has high influence for a friction coefficient, in a positive purpose. Uncertainty of measurement is decrease. The experiment acknowledges thesis, application of nano-layer on stylus of measuring tool eminently decreases a scatter of measurement, which is characterized by parameter of variability - by standard deviation.
  • Now, verification of surface structure was carried out experimentally only: application nano-layer on surface of the steel stylus of the dial gauge. The principle of verification was based on a hypothetical premise of measurement of a friction coefficient. The experiment showed nano-layer has high influence for a friction coefficient, in a positive purpose. Uncertainty of measurement is decrease. The experiment acknowledges thesis, application of nano-layer on stylus of measuring tool eminently decreases a scatter of measurement, which is characterized by parameter of variability - by standard deviation. (en)
Title
  • Nano-Layers in Metrology
  • Nano-Layers in Metrology (en)
  • Nanovrstvy v metrologii (cs)
skos:prefLabel
  • Nano-Layers in Metrology
  • Nano-Layers in Metrology (en)
  • Nanovrstvy v metrologii (cs)
skos:notation
  • RIV/68407700:21220/08:02142146!RIV09-MSM-21220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 381599
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21220/08:02142146
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • DLC; PACVD; dial gauge; metrology; nano-layer (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [79F7E81251C2]
http://linked.open...v/mistoKonaniAkce
  • Bielsko-Biała, Ustroń
http://linked.open...i/riv/mistoVydani
  • Bielsko-Biała
http://linked.open...i/riv/nazevZdroje
  • Coordinate Measuring Technique
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Podaný, Jan
  • Jech, Vladimír
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Wydawnictwo akademii techniczno-humanistycznej w Bielsku-Białej
https://schema.org/isbn
  • 978-83-60714-40-9
http://localhost/t...ganizacniJednotka
  • 21220
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