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Description
  • An advanced time integrated method has been developed for soft X-ray pulsed laser beam characterization. A technique based on poly (methyl methacrylate) - PMMA laser induced ablation has been used for beam investigations of soft X-ray laser sources like FLASH (Free-electron LASer in Hamburg; formerly known as VUV FEL and/or TTF2 FEL) and plasma-based Ne-like Zn laser performed at PALS (Prague Asterix Laser System). For the interaction experiments reported here, the FLASH system provided ultra-short pulses (~10-fs) of 21.7-nm radiation. The PMMA ablation was also induced by plasma-based Ne-like Zn soft X-ray laser pumped by NIR beams at the PALS facility.
  • An advanced time integrated method has been developed for soft X-ray pulsed laser beam characterization. A technique based on poly (methyl methacrylate) - PMMA laser induced ablation has been used for beam investigations of soft X-ray laser sources like FLASH (Free-electron LASer in Hamburg; formerly known as VUV FEL and/or TTF2 FEL) and plasma-based Ne-like Zn laser performed at PALS (Prague Asterix Laser System). For the interaction experiments reported here, the FLASH system provided ultra-short pulses (~10-fs) of 21.7-nm radiation. The PMMA ablation was also induced by plasma-based Ne-like Zn soft X-ray laser pumped by NIR beams at the PALS facility. (en)
  • Byla vyvinuta časově integrační metoda pro charakterizaci pulzu záření měkkého x laseru. Metoda je založena na ablaci poly (methyl methacrylatu) - PMMA. (cs)
Title
  • Utilizing ablation of solids to characterize a focused soft X-ray laser beam
  • Využití ablace pevných látek pro fokusaci měkkých laserových paprsků X (cs)
  • Utilizing ablation of solids to characterize a focused soft X-ray laser beam (en)
skos:prefLabel
  • Utilizing ablation of solids to characterize a focused soft X-ray laser beam
  • Využití ablace pevných látek pro fokusaci měkkých laserových paprsků X (cs)
  • Utilizing ablation of solids to characterize a focused soft X-ray laser beam (en)
skos:notation
  • RIV/68407700:21220/07:02133599!RIV08-MSM-21220___
http://linked.open.../vavai/riv/strany
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  • 457178
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  • RIV/68407700:21220/07:02133599
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  • focusing; soft X-ray (en)
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  • [054C41CB0CEE]
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  • Praha
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  • Washington
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  • Damage to VUV, EUV, and X-ray Optics
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  • Chalupský, J.
  • Homer, Pavel
  • Juha, L.
  • Rus, B.
  • Sobierajski, R.
  • Tiedtke, K.
  • Wabnitz, H.
  • Cihelka, J.
  • Mocek, T.
  • Hájková, V.
  • Feldhaus, J.
  • Kozlová, M.
  • Polan, J.
  • Krzywinsky, J.
  • Kuba, L.
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  • 21220
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