About: Defect studies of thin ZnO films prepared by pulsed laser deposition

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Description	Thin ZnO films were grown by pulsed laser deposition on four different substrates: sapphire (0 0 0 1), MgO (1 0 0), fused silica and nanocrystalline synthetic diamond. Defect studies by slow positron implantation spectroscopy (SPIS) revealed significantly higher concentration of defects in the studied films when compared to a bulk ZnO single crystal. The concentration of defects in the films deposited on single crystal sapphire and MgO substrates is higher than in the films deposited on amorphous fused silica substrate and nanocrystalline synthetic diamond. Furthermore, the effect of deposition temperature on film quality was investigated in ZnO films deposited on synthetic diamond substrates. Defect studies performed by SPIS revealed that the concentration of defects firstly decreases with increasing deposition temperature, but at too high deposition temperatures it increases again. The lowest concentration of defects was found in the film deposited at 450° C. Thin ZnO films were grown by pulsed laser deposition on four different substrates: sapphire (0 0 0 1), MgO (1 0 0), fused silica and nanocrystalline synthetic diamond. Defect studies by slow positron implantation spectroscopy (SPIS) revealed significantly higher concentration of defects in the studied films when compared to a bulk ZnO single crystal. The concentration of defects in the films deposited on single crystal sapphire and MgO substrates is higher than in the films deposited on amorphous fused silica substrate and nanocrystalline synthetic diamond. Furthermore, the effect of deposition temperature on film quality was investigated in ZnO films deposited on synthetic diamond substrates. Defect studies performed by SPIS revealed that the concentration of defects firstly decreases with increasing deposition temperature, but at too high deposition temperatures it increases again. The lowest concentration of defects was found in the film deposited at 450° C. (en)
Title	Defect studies of thin ZnO films prepared by pulsed laser deposition Defect studies of thin ZnO films prepared by pulsed laser deposition (en)
skos:prefLabel	Defect studies of thin ZnO films prepared by pulsed laser deposition Defect studies of thin ZnO films prepared by pulsed laser deposition (en)
skos:notation	RIV/68378271:_____/14:00441457!RIV15-GA0-68378271
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GAP108/11/0958)
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Lančok, Ján Novotný, Michal Bulíř, Jiří
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	9997
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/14:00441457
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	ZnO films; nanocrystalline diamond; slow positron implantation spectroscopy (en)
http://linked.open.../riv/klicoveSlovo	ZnO films slow positron implantation spectroscopy nanocrystalline diamond
http://linked.open...ontrolniKodProRIV	[95CE0CB5FB7C]
http://linked.open...v/mistoKonaniAkce	München
http://linked.open...i/riv/mistoVydani	Bristol
http://linked.open...i/riv/nazevZdroje	Journal of Physics: Conference Series
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	9 (xsd:int)
http://linked.open...vavai/riv/projekt	Investigation of point defects in ZnO and their interaction with hydrogen and nitrogen
http://linked.open...UplatneniVysledku	2014
http://linked.open...iv/tvurceVysledku	Anwand, W. Brauer, G. Lančok, Ján Novotný, Michal Bulíř, Jiří Procházka, I. Vlček, M. Čížek, J. Mosnier, J.-P.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000338216500021
http://linked.open.../riv/zahajeniAkce	2013-09-15 (xsd:date)
issn	1742-6588
number of pages	4 (xsd:int)
http://bibframe.org/vocab/doi	10.1088/1742-6596/505/1/012021
http://purl.org/ne...btex#hasPublisher	IOP Publishing Ltd

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