About: Microscopic characterization of graphene material and electronic quality across neighbouring, differently oriented copper grains

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We study graphene grown across the boundary of three such grains having bright, medium, and dark color in reflection. Raman micro-spectroscopy proves presence of mostly a monoor bi-layer graphene on all the grains. Yet intensity of Raman 2D band is grain-dependent: highest at the darkest grain and lowest at the brightest one. Contrary, conductive atomic force microscopy detects the highest conductivity at the brightest grain and the lowest current at the darkest grain. This is attributed to dominant electrical current path through graphene and underlying oxide thickness of which also depends on the type of copper grain. We correlate and discuss the results with view to better understanding of graphene growth and electronic properties on large area copper substrates. We study graphene grown across the boundary of three such grains having bright, medium, and dark color in reflection. Raman micro-spectroscopy proves presence of mostly a monoor bi-layer graphene on all the grains. Yet intensity of Raman 2D band is grain-dependent: highest at the darkest grain and lowest at the brightest one. Contrary, conductive atomic force microscopy detects the highest conductivity at the brightest grain and the lowest current at the darkest grain. This is attributed to dominant electrical current path through graphene and underlying oxide thickness of which also depends on the type of copper grain. We correlate and discuss the results with view to better understanding of graphene growth and electronic properties on large area copper substrates. (en)
Title	Microscopic characterization of graphene material and electronic quality across neighbouring, differently oriented copper grains Microscopic characterization of graphene material and electronic quality across neighbouring, differently oriented copper grains (en)
skos:prefLabel	Microscopic characterization of graphene material and electronic quality across neighbouring, differently oriented copper grains Microscopic characterization of graphene material and electronic quality across neighbouring, differently oriented copper grains (en)
skos:notation	RIV/68378271:_____/14:00434717!RIV15-GA0-68378271
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GBP108/12/G108)
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Ganzerová, Kristína Rezek, Bohuslav Čermák, Jan
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	29221
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/14:00434717
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	graphene; chemical vapor deposition; atomic force microscopy; Raman spectroscopy; electronic properties (en)
http://linked.open.../riv/klicoveSlovo	electronic properties Raman spectroscopy graphene atomic force microscopy chemical vapor deposition
http://linked.open...ontrolniKodProRIV	[417AA1EA6F2D]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Ostrava
http://linked.open...i/riv/nazevZdroje	NANOCON 2014 Conference Proceedings
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Preparation, modification and characterization of materials by radiation
http://linked.open...UplatneniVysledku	2014
http://linked.open...iv/tvurceVysledku	Rezek, Bohuslav Čermák, Jan Yamada, T. Ganzerová, Kristína
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2014-11-05 (xsd:date)
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Tanger s.r.o.
https://schema.org/isbn	978-80-87294-55-0

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