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Description
| - Amorphous SiCxNy films (of 2.2–2.7 μm) were deposited on Si(111) substrates by reactive DC magnetron sputtering. The SiC target with small excess of carbon was sputtered at various nitrogen/argon gas flow ratios (0–0.48).The as-deposited films were additionally annealed at temperatures of 700, 900 and 1100 °C in the air during 30 min and at 900 °C in vacuum during 1 h. The depth profile of hardness and elastic modulus (nanoindentation), change of the film thickness, film composition and structure (Raman and Infrared spectroscopy) were investigated in dependence on annealing temperature and content of nitrogen. The hardness of the as-deposited films decreases with the growth of nitrogen/argon flow ratio.Air annealing at 1100 °C leads to intensive surface oxidation and formation of graphite-like structure in carbon clusters of inner layers.
- Amorphous SiCxNy films (of 2.2–2.7 μm) were deposited on Si(111) substrates by reactive DC magnetron sputtering. The SiC target with small excess of carbon was sputtered at various nitrogen/argon gas flow ratios (0–0.48).The as-deposited films were additionally annealed at temperatures of 700, 900 and 1100 °C in the air during 30 min and at 900 °C in vacuum during 1 h. The depth profile of hardness and elastic modulus (nanoindentation), change of the film thickness, film composition and structure (Raman and Infrared spectroscopy) were investigated in dependence on annealing temperature and content of nitrogen. The hardness of the as-deposited films decreases with the growth of nitrogen/argon flow ratio.Air annealing at 1100 °C leads to intensive surface oxidation and formation of graphite-like structure in carbon clusters of inner layers. (en)
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Title
| - Effect of air annealing on mechanical properties and structure of SiCxNy magnetron sputtered films
- Effect of air annealing on mechanical properties and structure of SiCxNy magnetron sputtered films (en)
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skos:prefLabel
| - Effect of air annealing on mechanical properties and structure of SiCxNy magnetron sputtered films
- Effect of air annealing on mechanical properties and structure of SiCxNy magnetron sputtered films (en)
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skos:notation
| - RIV/68378271:_____/14:00427277!RIV15-GA0-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - I, P(ED2.1.00/03.0058), P(GAP108/12/1941), P(TA03010743)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/14:00427277
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - SiCN films; annealing; temperature stability; mechanical properties; structure (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - CH - Švýcarská konfederace
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Surface and Coatings Technology
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Jastrabík, L.
- Boháč, Petr
- Vorlíček, Vladimír
- Čtvrtlík, Radim
- Železný, Vladimír
- Kulikovsky, V.
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1016/j.surfcoat.2013.12.017
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