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  • With the development of hard X-ray free electron lasers, there is a pressing need to experimentally determine the single shot damage limits of presently used and potential future optical coating materials. To this end we present damage results, and analysis of fluence threshold limits, from grazing incidence geometry experiments conducted at the Spring-8 Angstrom Compact free electron LAser (SACLA) on Carbon coatings at 7 and 12 keV photon energies.
  • With the development of hard X-ray free electron lasers, there is a pressing need to experimentally determine the single shot damage limits of presently used and potential future optical coating materials. To this end we present damage results, and analysis of fluence threshold limits, from grazing incidence geometry experiments conducted at the Spring-8 Angstrom Compact free electron LAser (SACLA) on Carbon coatings at 7 and 12 keV photon energies. (en)
Title
  • Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL
  • Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL (en)
skos:prefLabel
  • Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL
  • Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL (en)
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  • RIV/68378271:_____/13:00424969!RIV14-AV0-68378271
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  • I
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  • 102695
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  • RIV/68378271:_____/13:00424969
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  • X-ray mirrors; damage results; carbon coatings (en)
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http://linked.open...ontrolniKodProRIV
  • [D0048BAB1FDB]
http://linked.open...v/mistoKonaniAkce
  • Praha
http://linked.open...i/riv/mistoVydani
  • Bellingham
http://linked.open...i/riv/nazevZdroje
  • Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
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  • Burian, Tomáš
  • Chalupský, Jaromír
  • Hájková, Věra
  • Juha, Libor
  • Sinn, H.
  • Sobierajski, R.
  • Störmer, M.
  • Tschentscher, T.
  • Ozkan, C.
  • Mancuso, A. P.
  • Yabashi, M.
  • Aquila, A.
  • Gauding, J.
  • Inubushi, Y.
  • Koyama, T.
  • Ohashi, H.
  • Tono, K.
http://linked.open...vavai/riv/typAkce
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  • 000329577700009
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number of pages
http://bibframe.org/vocab/doi
  • 10.1117/12.2017725
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  • SPIE
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  • 9780819495792
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