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rdf:type
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Description
| - Silicon crystalline samples were exposed to intense single pulses of XUV radiation (λ=13.5 nm) what lead to melting and ablation of the surface material. The deformation field around craters along the whole thickness of silicon wafers was observed by means of the synchrotron transmission section topography using the beam perpendicular to the surface of the sample.
- Silicon crystalline samples were exposed to intense single pulses of XUV radiation (λ=13.5 nm) what lead to melting and ablation of the surface material. The deformation field around craters along the whole thickness of silicon wafers was observed by means of the synchrotron transmission section topography using the beam perpendicular to the surface of the sample. (en)
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Title
| - Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
- Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography (en)
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skos:prefLabel
| - Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
- Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography (en)
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skos:notation
| - RIV/68378271:_____/13:00422836!RIV14-MSM-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - I, P(ED1.1.00/02.0061), P(EE.2.3.20.0087), P(EE2.3.30.0057), P(GAP108/11/1312), P(GAP205/11/0571), P(GAP208/10/2302)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/13:00422836
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - silicon; XUV; FEL; ablation; X-ray topography; deformation fields (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - GB - Spojené království Velké Británie a Severního Irska
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Radiation Physics and Chemistry
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Burian, Tomáš
- Chalupský, Jaromír
- Hájková, Věra
- Juha, Libor
- Vyšín, Luděk
- Gaudin, J.
- Gleeson, A. J.
- Klinger, D.
- Pelka, J. B.
- Sinn, H.
- Sobierajski, R.
- Tiedtke, K.
- Toleikis, S.
- Tschentscher, T.
- Wabnitz, H.
- Balcer, T.
- Wierzchowski, W.
- Wieteska, K.
- Zymierska, D.
- Paulmann, C.
- Sobota, D.
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1016/j.radphyschem.2013.04.025
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