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  • In the recent years, there was a growing interest for electronic devices operating in very harsh environments, at elevated temperatures, high power, high frequency, and high radiation fields.1,2 In that context, silicon carbide (SiC) is one of the most promising wide band gap materials for these devices due to its high breakdown electric field, high electron saturation velocity, high operating temperature, and high radiation hardness properties.
  • In the recent years, there was a growing interest for electronic devices operating in very harsh environments, at elevated temperatures, high power, high frequency, and high radiation fields.1,2 In that context, silicon carbide (SiC) is one of the most promising wide band gap materials for these devices due to its high breakdown electric field, high electron saturation velocity, high operating temperature, and high radiation hardness properties. (en)
Title
  • High performance SiC detectors for MeV ion beamsgenerated by intense pulsed laser plasmas
  • High performance SiC detectors for MeV ion beamsgenerated by intense pulsed laser plasmas (en)
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  • High performance SiC detectors for MeV ion beamsgenerated by intense pulsed laser plasmas
  • High performance SiC detectors for MeV ion beamsgenerated by intense pulsed laser plasmas (en)
skos:notation
  • RIV/68378271:_____/13:00399884!RIV14-MSM-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(ED1.1.00/02.0061), P(EE.2.3.20.0087)
http://linked.open...iv/cisloPeriodika
  • 1
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  • 77349
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/13:00399884
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  • silicon carbide; ion detectors; high power laser (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [ABFF30C7B24D]
http://linked.open...i/riv/nazevZdroje
  • Journal of Materials Research
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  • 28
http://linked.open...iv/tvurceVysledku
  • Margarone, Daniele
  • Musumeci, P.
  • Torrisi, L.
  • Ullschmied, Jiří
  • Velyhan, Andriy
  • Cutroneo, M.
  • Calcagno, L.
  • La Via, F.
  • Zimbone, M.
http://linked.open...ain/vavai/riv/wos
  • 000313589600013
issn
  • 0884-2914
number of pages
http://bibframe.org/vocab/doi
  • 10.1557/jmr.2012.211
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