About: Simultaneous current, force and dissipation measurements on the Si(111) 77 surface with an optimized qPlus AFM/STM technique

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About: Simultaneous current, force and dissipation measurements on the Si(111) 77 surface with an optimized qPlus AFM/STM technique Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We present the results of simultaneous scanning-tunneling and frequency-modulated dynamic atomic force microscopy measurements with a qPlus setup. The qPlus sensor is a purely electrical sensor based on a quartz tuning fork. If both the tunneling current and the force signal are to be measured at the tip, a cross-talk of the tunneling current with the force signal can easily occur. The origin and general features of the capacitive cross-talk will be discussed in detail in this contribution. We present the results of simultaneous scanning-tunneling and frequency-modulated dynamic atomic force microscopy measurements with a qPlus setup. The qPlus sensor is a purely electrical sensor based on a quartz tuning fork. If both the tunneling current and the force signal are to be measured at the tip, a cross-talk of the tunneling current with the force signal can easily occur. The origin and general features of the capacitive cross-talk will be discussed in detail in this contribution. (en)
Title	Simultaneous current, force and dissipation measurements on the Si(111) 77 surface with an optimized qPlus AFM/STM technique Simultaneous current, force and dissipation measurements on the Si(111) 77 surface with an optimized qPlus AFM/STM technique (en)
skos:prefLabel	Simultaneous current, force and dissipation measurements on the Si(111) 77 surface with an optimized qPlus AFM/STM technique Simultaneous current, force and dissipation measurements on the Si(111) 77 surface with an optimized qPlus AFM/STM technique (en)
skos:notation	RIV/68378271:_____/12:00390866!RIV13-GA0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GAP204/10/0952), P(GD202/09/H041), P(IAA100100905), P(ME10076), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	MAR
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Setvín, Martin Jelínek, Pavel Cháb, Vladimír Majzik, Zsolt
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	168102
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/12:00390866
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	AFM; STM; cross-talk; specific-site force spectroscopy; atomic resolution (en)
http://linked.open.../riv/klicoveSlovo	atomic resolution cross-talk specific-site force spectroscopy AFM STM
http://linked.open...odStatuVydavatele	DE - Spolková republika Německo
http://linked.open...ontrolniKodProRIV	[89B064ECC522]
http://linked.open...i/riv/nazevZdroje	Beilstein Journal of Nanotechnology
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Physics of nanostructures Atomic scale study of bimetallic nanostructures on the Si(100) surface Experimental and theoretical analysis of defects on metallic oxide and semiconductor surfaces. Assembling and characterization at atomic scale using atomic force microscopy
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	3
http://linked.open...iv/tvurceVysledku	Cháb, Vladimír Jelínek, Pavel Majzik, Zsolt Setvín, Martin Bettac, A. Feltz, A.
http://linked.open...ain/vavai/riv/wos	000301857600001
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	2190-4286
number of pages	11 (xsd:int)
http://bibframe.org/vocab/doi	10.3762/bjnano.3.28

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