About: Laser profiling of defects in BaWO4 crystals

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Optical inhomogeneities due to fluctuations in the index of refraction and scattering centres in four BaWO4 single crystals were measured by detecting the scattered light perpendicular to the incident laser beam. The depth profiling was achieved by moving the crystal along the laser beam and collecting the scattered light through a partly closed aperture. We have observed the region of the highest scattering from the beginning of the crystal to a depth of approximately 1 cm corresponding to the early stages of the crystal growth. Deeper inside in the crystal the concentration of the inhomogeneities is constant. The scattering in this region of relatively low defect density varies by less than one order of magnitude depending on crystal quality. Optical inhomogeneities due to fluctuations in the index of refraction and scattering centres in four BaWO4 single crystals were measured by detecting the scattered light perpendicular to the incident laser beam. The depth profiling was achieved by moving the crystal along the laser beam and collecting the scattered light through a partly closed aperture. We have observed the region of the highest scattering from the beginning of the crystal to a depth of approximately 1 cm corresponding to the early stages of the crystal growth. Deeper inside in the crystal the concentration of the inhomogeneities is constant. The scattering in this region of relatively low defect density varies by less than one order of magnitude depending on crystal quality. (en)
Title	Laser profiling of defects in BaWO4 crystals Laser profiling of defects in BaWO4 crystals (en)
skos:prefLabel	Laser profiling of defects in BaWO4 crystals Laser profiling of defects in BaWO4 crystals (en)
skos:notation	RIV/68378271:_____/12:00390713!RIV13-AV0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(LH12186), P(LH12236), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	8
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Remeš, Zdeněk Nikl, Martin Boháček, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	146485
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/12:00390713
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	barium tungstate; laser scattering; defects; Czochralski method (en)
http://linked.open.../riv/klicoveSlovo	Czochralski method defects barium tungstate laser scattering
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[98497D588D3A]
http://linked.open...i/riv/nazevZdroje	Measurement Science and Technology
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Quantum size effect in optoelectronic properties of nanostructures embedded in semiconductor layers. Mechanism of energy and charge transfer in semiconductor nanostructures
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	23
http://linked.open...iv/tvurceVysledku	Boháček, Pavel Nikl, Martin Remeš, Zdeněk
http://linked.open...ain/vavai/riv/wos	000306366600061
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0957-0233
number of pages	4 (xsd:int)
http://bibframe.org/vocab/doi	10.1088/0957-0233/23/8/087001

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