About: Variable light biasing method to measure component I-V characteristics of multi-junction solar cells

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About: Variable light biasing method to measure component I-V characteristics of multi-junction solar cells Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We present a new technique to measure component current-voltage (I-V) curves of individual sub-cells integrated in a monolithic multi-junction solar cell. This new approach, compared to all previously reported ones, is well suited for thin-film silicon p-i-n structures where the so-called shifting approximation, which supposes that illumination only shifts the I-V curve without changing its shape, is not valid. Moreover, the proposed method is particularly resistant to problems related to electrical shunts. The principle of this method lies in coupling the level of a selective light bias with the level of measured electrical current in order to fix the voltage of a selected sub-cell while sweeping over the current axis. When one of the sub-cells has a fixed voltage, it is then possible to get the I-V characteristics of the second one, shifted by a fixed voltage value. This measurement procedure is simple and requires no modeling. We present a new technique to measure component current-voltage (I-V) curves of individual sub-cells integrated in a monolithic multi-junction solar cell. This new approach, compared to all previously reported ones, is well suited for thin-film silicon p-i-n structures where the so-called shifting approximation, which supposes that illumination only shifts the I-V curve without changing its shape, is not valid. Moreover, the proposed method is particularly resistant to problems related to electrical shunts. The principle of this method lies in coupling the level of a selective light bias with the level of measured electrical current in order to fix the voltage of a selected sub-cell while sweeping over the current axis. When one of the sub-cells has a fixed voltage, it is then possible to get the I-V characteristics of the second one, shifted by a fixed voltage value. This measurement procedure is simple and requires no modeling. (en)
Title	Variable light biasing method to measure component I-V characteristics of multi-junction solar cells Variable light biasing method to measure component I-V characteristics of multi-junction solar cells (en)
skos:prefLabel	Variable light biasing method to measure component I-V characteristics of multi-junction solar cells Variable light biasing method to measure component I-V characteristics of multi-junction solar cells (en)
skos:notation	RIV/68378271:_____/12:00377804!RIV13-GA0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/09/0417), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	8
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Holovský, Jakub
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	177007
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/12:00377804
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	current-voltage characteristics; multi-junction; p-i-n; light bias (en)
http://linked.open.../riv/klicoveSlovo	current-voltage characteristics light bias multi-junction p-i-n
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[76D5CE6DCBC8]
http://linked.open...i/riv/nazevZdroje	Solar Energy Materials and Solar Cells
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	New non-destructive technique of measurement of I-V curves of monolithic multi-junction solar cells
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	103
http://linked.open...iv/tvurceVysledku	Holovský, Jakub Ballif, C. Despeisse, M. Bonnet-Eymard, M. Boccard, M.
http://linked.open...ain/vavai/riv/wos	000306044300020
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0927-0248
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.solmat.2012.04.014

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