Attributes | Values |
---|
rdf:type
| |
Description
| - CuIn1xAlxS2 thin films (x = 0, 0.09, 0.27, 0.46, 0.64, 0.82 and 1) with thicknesses of approximately 1 μm were formed by the sulfurization of DC sputtered Cu–In–Al precursors. All samples were sulfurized in a graphite container for 90 min at 650 °C in a 150 kPa Ar + S atmosphere. Final films were studied via X-ray diffraction (XRD), scanning electron microscopy (SEM) and micro-Raman spectroscopy. It was found that all samples were polycrystalline in nature and their lattice parameters varied slightly nonlinearly from {a = 5.49 Å, c = 11.02 Å} for CuInS2 to {a = 5.30 Å, c = 10.36 Å} for CuAlS2. No unwanted phases such as Cu2xS or others were observed. Raman were recorded at a room temperature and the most intensive and dominant A1 phonon frequency varied nonlinearly from 294 cm1 (CuInS2) to 314 cm1 (CuAlS2).
- CuIn1xAlxS2 thin films (x = 0, 0.09, 0.27, 0.46, 0.64, 0.82 and 1) with thicknesses of approximately 1 μm were formed by the sulfurization of DC sputtered Cu–In–Al precursors. All samples were sulfurized in a graphite container for 90 min at 650 °C in a 150 kPa Ar + S atmosphere. Final films were studied via X-ray diffraction (XRD), scanning electron microscopy (SEM) and micro-Raman spectroscopy. It was found that all samples were polycrystalline in nature and their lattice parameters varied slightly nonlinearly from {a = 5.49 Å, c = 11.02 Å} for CuInS2 to {a = 5.30 Å, c = 10.36 Å} for CuAlS2. No unwanted phases such as Cu2xS or others were observed. Raman were recorded at a room temperature and the most intensive and dominant A1 phonon frequency varied nonlinearly from 294 cm1 (CuInS2) to 314 cm1 (CuAlS2). (en)
|
Title
| - CuIn1xAlxS2 thin films prepared by sulfurization of metallic precursors
- CuIn1xAlxS2 thin films prepared by sulfurization of metallic precursors (en)
|
skos:prefLabel
| - CuIn1xAlxS2 thin films prepared by sulfurization of metallic precursors
- CuIn1xAlxS2 thin films prepared by sulfurization of metallic precursors (en)
|
skos:notation
| - RIV/68378271:_____/11:00375572!RIV12-AV0-68378271
|
http://linked.open...avai/riv/aktivita
| |
http://linked.open...avai/riv/aktivity
| |
http://linked.open...iv/cisloPeriodika
| |
http://linked.open...vai/riv/dodaniDat
| |
http://linked.open...aciTvurceVysledku
| |
http://linked.open.../riv/druhVysledku
| |
http://linked.open...iv/duvernostUdaju
| |
http://linked.open...titaPredkladatele
| |
http://linked.open...dnocenehoVysledku
| |
http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/11:00375572
|
http://linked.open...riv/jazykVysledku
| |
http://linked.open.../riv/klicovaSlova
| - CuIn1xAlxS2; CIAS; chalcopyrites; Raman spectroscopy; solar cells (en)
|
http://linked.open.../riv/klicoveSlovo
| |
http://linked.open...odStatuVydavatele
| |
http://linked.open...ontrolniKodProRIV
| |
http://linked.open...i/riv/nazevZdroje
| - Journal of Alloys and Compounds
|
http://linked.open...in/vavai/riv/obor
| |
http://linked.open...ichTvurcuVysledku
| |
http://linked.open...cetTvurcuVysledku
| |
http://linked.open...UplatneniVysledku
| |
http://linked.open...v/svazekPeriodika
| |
http://linked.open...iv/tvurceVysledku
| - Darveau, S. A.
- Exstrom, C. L.
- Flannery, L. E.
- Ianno, N. J.
- Kment, Štěpán
- Olejníček, Jiří
- Soukup, R. J.
|
http://linked.open...ain/vavai/riv/wos
| |
http://linked.open...n/vavai/riv/zamer
| |
issn
| |
number of pages
| |
http://bibframe.org/vocab/doi
| - 10.1016/j.jallcom.2011.08.016
|