About: Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors     Goto   Sponge   NotDistinct   Permalink

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Description
  • Real-time ion diagnostics have been performed by the use of various time-of-flight (TOF) detectors: ion collectors (ICs) with and without absorber thin films, new prototypes of single-crystal diamond and silicon carbide detectors, and an electrostatic ion mass spectrometer (IEA). In order to suppress the long photopeak induced by soft X-rays and to avoid the overlap with the signal from ultrafast particles, the ICs have been shielded with Al foil filters. The application of large-bandgap semiconductor detectors (>3 eV) ensured cutting of the plasma-emitted visible and soft-UV radiation and enhancing the sensitivity to the very fast proton/ion beams. Employing the IEA spectrometer, various ion species and charge states in the expanding laser-plasma have been determined.
  • Real-time ion diagnostics have been performed by the use of various time-of-flight (TOF) detectors: ion collectors (ICs) with and without absorber thin films, new prototypes of single-crystal diamond and silicon carbide detectors, and an electrostatic ion mass spectrometer (IEA). In order to suppress the long photopeak induced by soft X-rays and to avoid the overlap with the signal from ultrafast particles, the ICs have been shielded with Al foil filters. The application of large-bandgap semiconductor detectors (>3 eV) ensured cutting of the plasma-emitted visible and soft-UV radiation and enhancing the sensitivity to the very fast proton/ion beams. Employing the IEA spectrometer, various ion species and charge states in the expanding laser-plasma have been determined. (en)
Title
  • Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors
  • Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors (en)
skos:prefLabel
  • Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors
  • Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors (en)
skos:notation
  • RIV/68378271:_____/11:00364302!RIV12-AV0-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(7E09092), P(GAP205/11/1165), Z(AV0Z10100523), Z(AV0Z20430508)
http://linked.open...iv/cisloPeriodika
  • 10
http://linked.open...vai/riv/dodaniDat
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  • 200487
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  • RIV/68378271:_____/11:00364302
http://linked.open...riv/jazykVysledku
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  • aluminium; chemical sensors; diamond; electrostatics; iodine; ion beams; thin films; lasers; time of flight spectrometers (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [A6C09809FC61]
http://linked.open...i/riv/nazevZdroje
  • Journal of Applied Physics
http://linked.open...in/vavai/riv/obor
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http://linked.open...vavai/riv/projekt
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http://linked.open...v/svazekPeriodika
  • 109
http://linked.open...iv/tvurceVysledku
  • Krása, Josef
  • Mocek, Tomáš
  • Rus, Bedřich
  • Giuffrida, L.
  • Láska, Leoš
  • Margarone, Daniele
  • Musumeci, P.
  • Nowak, T.
  • Picciotto, A.
  • Prokůpek, Jan
  • Torrisi, L.
  • Ullschmied, Jiří
  • Velyhan, Andriy
http://linked.open...ain/vavai/riv/wos
  • 000292115900043
http://linked.open...n/vavai/riv/zamer
issn
  • 0021-8979
number of pages
http://bibframe.org/vocab/doi
  • 10.1063/1.3585871
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