About: Time-resolved diagnostics of dual high power impulse magnetron sputtering with pulse delays of 15 μs and 500 μs     Goto   Sponge   NotDistinct   Permalink

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  • Time-resolved measurements have been performed during dual High Power Impulse Magnetron Sputtering (dual-HiPIMS) with two cathodes in a closed magnetic field configuration. The effect of a delay between subsequent pulses on electron density, mean electron energy, and ion flux to the substrate was investigated by time-resolved diagnostic methods. Two different delays of 15 μs and 500 μs between subsequent pulses were investigated. The dual-HiPIMS system, operated at a repetition frequency f = 100 Hz and duty cycle of 1 %, was equipped with different metallic targets (Ti, Cu). It is shown that a delay between subsequent pulses influences the plasma parameters and can be used to control deposition processes. It was noted that target surfaces (alternately serving as a cathode/anode) are contaminated by sputtered material from the previous pulse which influences the time-evolution of the discharge parameters.
  • Time-resolved measurements have been performed during dual High Power Impulse Magnetron Sputtering (dual-HiPIMS) with two cathodes in a closed magnetic field configuration. The effect of a delay between subsequent pulses on electron density, mean electron energy, and ion flux to the substrate was investigated by time-resolved diagnostic methods. Two different delays of 15 μs and 500 μs between subsequent pulses were investigated. The dual-HiPIMS system, operated at a repetition frequency f = 100 Hz and duty cycle of 1 %, was equipped with different metallic targets (Ti, Cu). It is shown that a delay between subsequent pulses influences the plasma parameters and can be used to control deposition processes. It was noted that target surfaces (alternately serving as a cathode/anode) are contaminated by sputtered material from the previous pulse which influences the time-evolution of the discharge parameters. (en)
Title
  • Time-resolved diagnostics of dual high power impulse magnetron sputtering with pulse delays of 15 μs and 500 μs
  • Time-resolved diagnostics of dual high power impulse magnetron sputtering with pulse delays of 15 μs and 500 μs (en)
skos:prefLabel
  • Time-resolved diagnostics of dual high power impulse magnetron sputtering with pulse delays of 15 μs and 500 μs
  • Time-resolved diagnostics of dual high power impulse magnetron sputtering with pulse delays of 15 μs and 500 μs (en)
skos:notation
  • RIV/68378271:_____/11:00359582!RIV12-AV0-68378271
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  • P(1M06002), P(GA202/09/0800), P(GAP205/11/0386), P(GP202/09/P159), P(KAN301370701), P(KJB100100805), S, Z(AV0Z10100522), Z(MSM0021620834)
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  • 2-3
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  • 235385
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  • RIV/68378271:_____/11:00359582
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  • time-resolved plasma diagnostics; optical emission spectroscopy; Langmuir probe; magnetron sputtering (en)
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  • DE - Spolková republika Německo
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  • [D9814F3D1A98]
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  • Contributions to Plasma Physics
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  • 51
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  • Hubička, Zdeněk
  • Drache, S.
  • Hippler, R.
  • Straňák, V.
  • Čada, Martin
  • Tichý, M.
http://linked.open...ain/vavai/riv/wos
  • 000288610800020
http://linked.open...n/vavai/riv/zamer
issn
  • 0863-1042
number of pages
http://bibframe.org/vocab/doi
  • 10.1002/ctpp.201000065
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