About: Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions. Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions. (en)
Title	Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon (en)
skos:prefLabel	Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon (en)
skos:notation	RIV/68378271:_____/10:00354945!RIV11-GA0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD202/09/H041), P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	21
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Stuchlík, Jiří Rezek, Bohuslav Kočka, Jan Šípek, Emil Verveniotis, Elisseos
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	285689
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/10:00354945
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	amorphous materials; atomic force microscopy (AFM); conductivity; crystallization; nanostructures; silicon; nickel (en)
http://linked.open.../riv/klicoveSlovo	conductivity crystallization nickel silicon atomic force microscopy (AFM) nanostructures amorphous materials
http://linked.open...odStatuVydavatele	CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV	[5F9C92AD3B2A]
http://linked.open...i/riv/nazevZdroje	Thin Solid Films
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Physics of nanostructures Functional hybrid nanosystems of semiconductors and metals with organic materials (FUNS) Structures for Nanophotonics and Nanoelectronics
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	518
http://linked.open...iv/tvurceVysledku	Rezek, Bohuslav Stuchlík, Jiří Verveniotis, Elisseos Kočka, Jan Šípek, Emil
http://linked.open...ain/vavai/riv/wos	000280989100016
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0040-6090
number of pages	6 (xsd:int)

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