About: Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements     Goto   Sponge   NotDistinct   Permalink

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  • The crystal structure and complex twinning microstructure of epitaxial Ni–Mn–Ga films on (1 0 0) MgO substrates was studied by X-ray diffraction using 2θ scans, pole figure measurements and reciprocal space mapping (RSM). Above the martensitic transformation temperature the film consists of single austenite phase with lattice constant a = 5.81A at 419 K. At room temperature some epitaxially grown residual austenite with a = 5.79A remains at the interface with the substrate, followed by an intermediate layer exhibiting orthorhombic distortion, atrans = 6.05A, btrans = 5.87A, ctrans = 5.73A and a major fraction of 14M (7M) martensite, a = 6.16A, b = 5.79A, c = 5.48A. The seven-layered modulation of this metastable martensite structure is directly observed by RSM. The intermediate phase observed close to interface indicates the existence of an instable, pre-adaptive martensite phase with a short stacking period.
  • The crystal structure and complex twinning microstructure of epitaxial Ni–Mn–Ga films on (1 0 0) MgO substrates was studied by X-ray diffraction using 2θ scans, pole figure measurements and reciprocal space mapping (RSM). Above the martensitic transformation temperature the film consists of single austenite phase with lattice constant a = 5.81A at 419 K. At room temperature some epitaxially grown residual austenite with a = 5.79A remains at the interface with the substrate, followed by an intermediate layer exhibiting orthorhombic distortion, atrans = 6.05A, btrans = 5.87A, ctrans = 5.73A and a major fraction of 14M (7M) martensite, a = 6.16A, b = 5.79A, c = 5.48A. The seven-layered modulation of this metastable martensite structure is directly observed by RSM. The intermediate phase observed close to interface indicates the existence of an instable, pre-adaptive martensite phase with a short stacking period. (en)
Title
  • Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements
  • Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements (en)
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  • Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements
  • Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements (en)
skos:notation
  • RIV/68378271:_____/10:00353131!RIV11-AV0-68378271
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  • Z(AV0Z10100520)
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  • 20
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  • 282118
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  • RIV/68378271:_____/10:00353131
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  • reciprocal space mapping; thin film; Ni–Mn–Ga; martensite; magnetic shape memory (en)
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  • GB - Spojené království Velké Británie a Severního Irska
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  • [F204E525438C]
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  • Acta Materialia
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  • 58
http://linked.open...iv/tvurceVysledku
  • Fähler, S.
  • Heczko, Oleg
  • Hannula, S.-P.
  • Ge, Y.
http://linked.open...ain/vavai/riv/wos
  • 000284446500012
http://linked.open...n/vavai/riv/zamer
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  • 1359-6454
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