About: Decomposition of mixed phase silicon Raman spectra

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Description	Series of Raman spectra were measured for microcrystalline silicon thin film with variable crystallinity. Five sets of Raman spectra (corresponding to excitations at 325 nm, 442 nm, 514.5 nm, 632.8 nm and 785 nm wavelengths) were subjected to factor analysis which showed that each set of spectra consisted of just two independent spectral components. Decomposition of the measured Raman spectra into the amorphous and the microcrystalline components is illustrated for 514.5 nm and 632.8 nm excitations. Effect of the light scattering on absolute intensity of Raman spectra was identified even for excitation wavelength highly absorbed in the mixed phase silicon layers. Series of Raman spectra were measured for microcrystalline silicon thin film with variable crystallinity. Five sets of Raman spectra (corresponding to excitations at 325 nm, 442 nm, 514.5 nm, 632.8 nm and 785 nm wavelengths) were subjected to factor analysis which showed that each set of spectra consisted of just two independent spectral components. Decomposition of the measured Raman spectra into the amorphous and the microcrystalline components is illustrated for 514.5 nm and 632.8 nm excitations. Effect of the light scattering on absolute intensity of Raman spectra was identified even for excitation wavelength highly absorbed in the mixed phase silicon layers. (en)
Title	Decomposition of mixed phase silicon Raman spectra Decomposition of mixed phase silicon Raman spectra (en)
skos:prefLabel	Decomposition of mixed phase silicon Raman spectra Decomposition of mixed phase silicon Raman spectra (en)
skos:notation	RIV/68378271:_____/09:00339516!RIV10-MSM-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Fejfar, Antonín Ledinský, Martin Stuchlík, Jiří Vetushka, Aliaksi Kočka, Jan
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	309210
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/09:00339516
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Raman spectroscopy; silicon thin films; photovoltaics (en)
http://linked.open.../riv/klicoveSlovo	photovoltaics Raman spectroscopy silicon thin films
http://linked.open...ontrolniKodProRIV	[E549212A62CF]
http://linked.open...v/mistoKonaniAkce	San Francisco, CA
http://linked.open...i/riv/mistoVydani	Warrendale, PA
http://linked.open...i/riv/nazevZdroje	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology — 2009
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Functional hybrid nanosystems of semiconductors and metals with organic materials (FUNS) Structures for Nanophotonics and Nanoelectronics
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Ledinský, Martin Fejfar, Antonín Stuchlík, Jiří Kočka, Jan Vetushka, Aliaksi
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-04-13 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Materials Research Society
https://schema.org/isbn	978-1-60511-126-1

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