About: Damage studies of multilayer optics for XUV free electron lasers

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We exposed standard Mo/Si multilayer coatings, optimized for 13.5 nm radiation to the intense femtosecond XUV radiation at the FLASH free electron laser facility at intensities below and above the multilayer ablation threshold. The interaction process was studied in-situ with reflectometry and time resolved optical microscopy, and ex-situ with optical microscopy (Nomarski), atomic force microscopy and high resolution transmission electron microscopy. From analysis of the size of the observed craters as a function of the pulse energy the threshold for irreversible damage of the multilayer could be determined to be 45 mJ/cm2. The damage occurs on a longer time scale than the XUV pulse and even above the damage threshold XUV reflectance has been observed showing no measurable loss up to a power density of 1013 W/cm2. A first explanation of the physics mechanism leading to damage is given. We exposed standard Mo/Si multilayer coatings, optimized for 13.5 nm radiation to the intense femtosecond XUV radiation at the FLASH free electron laser facility at intensities below and above the multilayer ablation threshold. The interaction process was studied in-situ with reflectometry and time resolved optical microscopy, and ex-situ with optical microscopy (Nomarski), atomic force microscopy and high resolution transmission electron microscopy. From analysis of the size of the observed craters as a function of the pulse energy the threshold for irreversible damage of the multilayer could be determined to be 45 mJ/cm2. The damage occurs on a longer time scale than the XUV pulse and even above the damage threshold XUV reflectance has been observed showing no measurable loss up to a power density of 1013 W/cm2. A first explanation of the physics mechanism leading to damage is given. (en)
Title	Damage studies of multilayer optics for XUV free electron lasers Damage studies of multilayer optics for XUV free electron lasers (en)
skos:prefLabel	Damage studies of multilayer optics for XUV free electron lasers Damage studies of multilayer optics for XUV free electron lasers (en)
skos:notation	RIV/68378271:_____/09:00335976!RIV10-MSM-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA400100701), P(KAN300100702), P(LA08024), P(LC510), P(LC528), Z(AV0Z10100523)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Cihelka, Jaroslav Chalupský, Jaromír Hájková, Věra Juha, Libor
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	309000
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/09:00335976
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	multilayer mirror; radiation damage; soft x-rays; free-electron laser (en)
http://linked.open.../riv/klicoveSlovo	free-electron laser soft x-rays radiation damage multilayer mirror
http://linked.open...ontrolniKodProRIV	[18F0E24B3B9E]
http://linked.open...v/mistoKonaniAkce	Prague
http://linked.open...i/riv/mistoVydani	Bellingham
http://linked.open...i/riv/nazevZdroje	Damage to VUV, EUV, and X-ray Optics II
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	18 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Creating and probing nanostructures with X-ray lasers Research in the Frame of the International Center for Dense Magnetized Plasmas - ICDMP Centre of Laser Plasma Metal-Fullerene and Metal-Diamond Nanocomposites: Preparation, Characterization and Modification
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Chalupský, Jaromír Hájková, Věra Juha, Libor Bijkerk, F. Cihelka, Jaroslav Gaudin, J. Gullikson, E. M. Jurek, M. Khorsand, A. R. Klinger, D. Louis, E. Pelka, J. B. Sobierajski, R. Toleikis, S. Wabnitz, H. Jastrow, U. van Hattum, E. D. Tiedtke, K. I.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-04-21 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Intense Radiation Sources and Radiation-Matter Interaction
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	SPIE
https://schema.org/isbn	9780819476357

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