About: Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Starting with the demonstration of efficient photoluminescence of silicon nanocrystals, nanocrystalline silicon is ranked among the most studied semiconductor materials. Its main prospect is assigned to the possibility of constructing a silicon based laser, which could be easily integrated into present microelectronic chips. To attain higher optical gain it is necessary to investigate and identify processes in Si NCs. We investigated the processes extending time scales from hundreds of femtosecond to miliseconds, namely by up-conversion technique, by a streak camera and a PMT. We studied the processes in various Si NC systems, including also organically passivated NCs which allowed us to distinguish between intrinsic Si NC properties and effects of Si SiO2 interface. Time-resolved spectroscopy were extended by optical gain measurements and measurements of nonlinear properties by using two-photon absorption. Starting with the demonstration of efficient photoluminescence of silicon nanocrystals, nanocrystalline silicon is ranked among the most studied semiconductor materials. Its main prospect is assigned to the possibility of constructing a silicon based laser, which could be easily integrated into present microelectronic chips. To attain higher optical gain it is necessary to investigate and identify processes in Si NCs. We investigated the processes extending time scales from hundreds of femtosecond to miliseconds, namely by up-conversion technique, by a streak camera and a PMT. We studied the processes in various Si NC systems, including also organically passivated NCs which allowed us to distinguish between intrinsic Si NC properties and effects of Si SiO2 interface. Time-resolved spectroscopy were extended by optical gain measurements and measurements of nonlinear properties by using two-photon absorption. (en)
Title	Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy (en)
skos:prefLabel	Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy (en)
skos:notation	RIV/68378271:_____/09:00331262!RIV10-MSM-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/07/0818), P(IAA101120804), P(LC510), Z(AV0Z10100521)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Kůsová, Kateřina Dohnalová, Kateřina Cibulka, Ondřej Pelant, Ivan Žídek, Karel
http://linked.open.../riv/druhVysledku	O - Ostatní výsledky nezařaditelné do žádného z výše uvedených druhů výsledku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	329718
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/09:00331262
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	silicon; nanocrystal; spectroscopy; recombination (en)
http://linked.open.../riv/klicoveSlovo	silicon spectroscopy recombination nanocrystal
http://linked.open...ontrolniKodProRIV	[3E08F4685CF3]
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	12 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Silicon nanostructures for photonics Silicon nanophotonics - from single nanocrystals to photonic structures
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Malý, P. Dohnalová, Kateřina Cibulka, Ondřej Kůsová, Kateřina Pelant, Ivan Trojánek, F. Gilliot, P. Hönerlage, B. Oberlé, J. Žídek, Karel Crégut, O. Jonusauskas, G.
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films

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