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Description
  • Preparation of thin film silicon at high growth rate is an important target for its application in solar cells. The properties of hydrogenated microcrystalline silicon, prepared with the help of PECVD multi-hole cathode in a high pressure and depletion regime in a wide range of thicknesses are described in detail. We illustrate the surprising result that we can prepare high growth rate microcrystalline silicon from 0.4 up to 30 μm thickness without great peel-off problems. The room temperature dark DC conductivity, as well as the crystallinity, increased up to 5 μm film thickness and then started to decrease again. These results are explained by the initial temperature profiling and a thickness-induced increase of the lateral inhomogeneity.
  • Preparation of thin film silicon at high growth rate is an important target for its application in solar cells. The properties of hydrogenated microcrystalline silicon, prepared with the help of PECVD multi-hole cathode in a high pressure and depletion regime in a wide range of thicknesses are described in detail. We illustrate the surprising result that we can prepare high growth rate microcrystalline silicon from 0.4 up to 30 μm thickness without great peel-off problems. The room temperature dark DC conductivity, as well as the crystallinity, increased up to 5 μm film thickness and then started to decrease again. These results are explained by the initial temperature profiling and a thickness-induced increase of the lateral inhomogeneity. (en)
  • Příprava tenkých křemíkových vrstev za vysoké rychlosti růstu je důležitým cílem pro použití ve slunečních článcích. Jsou popsány vlastnosti hydrogenovaného mikrokrystalického křemíku připraveného pomocí PECVD s mnohonásobnou dutinovou katodou při vysokém tlaku v režimu ochuzené směsi v rozsahu tlouštěk od 0,4 μm až do 30 μm bez problémů s loupáním vrstev. (cs)
Title
  • Properties of thin film silicon, prepared at high growth rate in a wide range of thicknesses
  • Properties of thin film silicon, prepared at high growth rate in a wide range of thicknesses (en)
  • Vlastnosti tenkých křemíkových vrstev připravených vysokou rychlostí růstu v širokém rozsahu tlouštěk (cs)
skos:prefLabel
  • Properties of thin film silicon, prepared at high growth rate in a wide range of thicknesses
  • Properties of thin film silicon, prepared at high growth rate in a wide range of thicknesses (en)
  • Vlastnosti tenkých křemíkových vrstev připravených vysokou rychlostí růstu v širokém rozsahu tlouštěk (cs)
skos:notation
  • RIV/68378271:_____/08:00320320!RIV09-AV0-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GD202/05/H003), P(IAA1010316), P(IAA1010413), P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika
  • 19-25
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 390517
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/08:00320320
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • conductivity; plasma deposition (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [1D6D89B9E6A2]
http://linked.open...i/riv/nazevZdroje
  • Journal of Non-Crystalline Solids
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 354
http://linked.open...iv/tvurceVysledku
  • Ledinský, Martin
  • Fejfar, Antonín
  • Stuchlík, Jiří
  • Kočka, Jan
  • Stuchlíková, The-Ha
  • Mates, Tomáš
http://linked.open...ain/vavai/riv/wos
  • 000256500400084
http://linked.open...n/vavai/riv/zamer
issn
  • 0022-3093
number of pages
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