About: Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine     Goto   Sponge   NotDistinct   Permalink

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Description
  • Surface topography has great importance in specifying quality of a surface. A significant proportion of component failure starts at the surface due to either an isolated manufacturing discontinuity or gradual deterioration of the surface quality. The most important parameter describing surface integrity is surface roughness. In the manufacturing industry, surface must be within certain limits of roughness.
  • Surface topography has great importance in specifying quality of a surface. A significant proportion of component failure starts at the surface due to either an isolated manufacturing discontinuity or gradual deterioration of the surface quality. The most important parameter describing surface integrity is surface roughness. In the manufacturing industry, surface must be within certain limits of roughness. (en)
  • Topografie povrchu má velký vliv na specifikaci jeho kvality. Jedna z podstatných vlastností popisujících povrch je drsnost povrchu. Kontrola parametrů drsnosti po squarování Si ingotů je hlavním předmětem příspěvku. (cs)
Title
  • Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine
  • Měření drsnosti povrchu křemíkových ingotů po squarování (cs)
  • Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine (en)
skos:prefLabel
  • Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine
  • Měření drsnosti povrchu křemíkových ingotů po squarování (cs)
  • Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine (en)
skos:notation
  • RIV/68378271:_____/06:00079494!RIV07-AV0-68378271
http://linked.open.../vavai/riv/strany
  • 202;207
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(1M06002), Z(AV0Z10100522), Z(MSM6198959213)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 498015
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/06:00079494
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • roughness; squaring; Talysurf (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [897F87FF9AFD]
http://linked.open...v/mistoKonaniAkce
  • Rožnov pod Radhoštěm
http://linked.open...i/riv/mistoVydani
  • Rožnov pod Radhoštěm
http://linked.open...i/riv/nazevZdroje
  • SILICON 2006
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hiklová, Helena
  • Schovánek, Petr
  • Havelková, Martina
  • Vojtěchovská, J.
  • Vojtěchovský, K.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • TECON Scientific
https://schema.org/isbn
  • 80-239-7781-4
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