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  • Velkou výhodou interferometrie v bílém světle je, že může být použita pro měření výškového profilu předmětu s drsným povrchem. Speklový obrazec, který se objeví v obrazové rovině, umožňuje pozorovat interference, zároveň však je tento obrazec zdrojem nejistoty měření. Odvodili jsme teoretické meze podélné nejistoty měření pomocí statistiky prvního řádu speklového obrazce (cs)
  • A great advantage of the white-light interferometry is that it can be used for profile measurement of objects with a rough surface. A speckle pattern that arises in the image plane allows one to observe the interference; however, this pattern is also the source of the measurement uncertainty. We derive the theoretical limits of the longitudinal uncertainty by virtue of the first-order statistics of the speckle pattern
  • A great advantage of the white-light interferometry is that it can be used for profile measurement of objects with a rough surface. A speckle pattern that arises in the image plane allows one to observe the interference; however, this pattern is also the source of the measurement uncertainty. We derive the theoretical limits of the longitudinal uncertainty by virtue of the first-order statistics of the speckle pattern (en)
Title
  • Theoretical measurement uncertainity of white-light interferometry on rough surfaces
  • Theoretical measurement uncertainity of white-light interferometry on rough surfaces (en)
  • Teoretická nejistota měření interferometrie v bílém světle na drsných površích (cs)
skos:prefLabel
  • Theoretical measurement uncertainity of white-light interferometry on rough surfaces
  • Theoretical measurement uncertainity of white-light interferometry on rough surfaces (en)
  • Teoretická nejistota měření interferometrie v bílém světle na drsných površích (cs)
skos:notation
  • RIV/68378271:_____/03:00104240!RIV/2005/MSM/A02005/N
http://linked.open.../vavai/riv/strany
  • 1809;1813
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(LN00A015)
http://linked.open...iv/cisloPeriodika
  • 10
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 630830
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/03:00104240
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • white-light interferometry (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [A001DEDDE1E8]
http://linked.open...i/riv/nazevZdroje
  • Applied Optics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 42
http://linked.open...iv/tvurceVysledku
  • Soubusta, Jan
  • Pavlíček, Pavel
issn
  • 0003-6935
number of pages
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