About: A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers.

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About: A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers. Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	A new approach to the surface photovoltage method is demonstrated on thick undoped microcrystalline silicon films grown on different substrates. A new approach to the surface photovoltage method is demonstrated on thick undoped microcrystalline silicon films grown on different substrates. (en)
Title	A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers. A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers. (en)
skos:prefLabel	A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers. A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers. (en)
skos:notation	RIV/68378271:_____/01:02010203!RIV/2003/AV0/A02003/N
http://linked.open.../vavai/riv/strany	405;410
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/98/0669), P(IAA1010809), Z(AV0Z1010914), Z(MSM 113200002)
http://linked.open...iv/cisloPeriodika	6
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Fejfar, Antonín Pelant, Ivan Švrček, Vladimír Kočka, Jan
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	672200
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/01:02010203
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	surface photvoltage; - microcrystalline silicon; - diffusion length (en)
http://linked.open.../riv/klicoveSlovo	- diffusion length - microcrystalline silicon surface photvoltage
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[2BCA5B32E034]
http://linked.open...i/riv/nazevZdroje	Philosophical Magazine Letters
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Nanostructured semiconductor materials-improvement of technology, electronic and optical properties Diagnostics of the non-crystalline forms of silicon with nanometer and femtosecond resolution
http://linked.open...UplatneniVysledku	2001
http://linked.open...v/svazekPeriodika	81
http://linked.open...iv/tvurceVysledku	Toušek, J. Fejfar, Antonín Pelant, Ivan Kočka, Jan Švrček, Vladimír Matsuda, A. Kondo, M.
http://linked.open...n/vavai/riv/zamer	Experimentální a teoretický výzkum kondenzovaných systémů s význačnými fyzikálními vlastnostmi http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20113200002
issn	0950-0839
number of pages	6 (xsd:int)

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