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  • We report on an evaluation of the influence that fast changes of the refractive index has on the uncertainty of interferometric displacement measurement. Measurement of position within a limited range is typical for coordinate measuring systems such as nanometrology standards combining scanning probe microscopy (SPM) with precise positioning. For long-range systems the varying refractive index of air contributes the most to the overall uncertainty. We proposed to extend the principle of compensation of the fluctuations of the refractive index of air through monitoring the optical length within the measuring range of the displacement measuring interferometer. In this contribution we evaluate the level of uncertainty associated with the nature of the fluctuations of the refractive index of air in laser interferometry. We have observed that its fast variations, seen as length noise, are not linearly proportional to the measuring beam path but play a significant role only over distances longer than 50 mm. Over longer distances the length noise rises proportionally. The measurements were performed under conditions typical for metrology SPM systems.
  • We report on an evaluation of the influence that fast changes of the refractive index has on the uncertainty of interferometric displacement measurement. Measurement of position within a limited range is typical for coordinate measuring systems such as nanometrology standards combining scanning probe microscopy (SPM) with precise positioning. For long-range systems the varying refractive index of air contributes the most to the overall uncertainty. We proposed to extend the principle of compensation of the fluctuations of the refractive index of air through monitoring the optical length within the measuring range of the displacement measuring interferometer. In this contribution we evaluate the level of uncertainty associated with the nature of the fluctuations of the refractive index of air in laser interferometry. We have observed that its fast variations, seen as length noise, are not linearly proportional to the measuring beam path but play a significant role only over distances longer than 50 mm. Over longer distances the length noise rises proportionally. The measurements were performed under conditions typical for metrology SPM systems. (en)
Title
  • Air flow and length noise in displacement interferometry
  • Air flow and length noise in displacement interferometry (en)
skos:prefLabel
  • Air flow and length noise in displacement interferometry
  • Air flow and length noise in displacement interferometry (en)
skos:notation
  • RIV/68081731:_____/14:00441268!RIV15-TA0-68081731
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(ED0017/01/01), P(GB14-36681G), P(LO1212), P(TA01010995), P(TA02010711), P(TE01020233)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 1912
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/14:00441268
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • refractometry; refractive index of air; interferometer; measuring system (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [C322D703A2E3]
http://linked.open...v/mistoKonaniAkce
  • Liberec
http://linked.open...i/riv/mistoVydani
  • Bellingham
http://linked.open...i/riv/nazevZdroje
  • Optics and Measurement Conference 2014 (Proceedings of SPIE 9442)
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Lazar, Josef
  • Číp, Ondřej
  • Šarbort, Martin
  • Holá, Miroslava
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
issn
  • 0277-786X
number of pages
http://bibframe.org/vocab/doi
  • 10.1117/12.2176179
http://purl.org/ne...btex#hasPublisher
  • SPIE
https://schema.org/isbn
  • 9781628415575
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