About: Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM     Goto   Sponge   NotDistinct   Permalink

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  • Cerium activated single crystals of yttrium aluminium garnet (YAG:Ce) Y3-xCexAl5O12 are widely used as scintillators in electron detectors for S(T)EM. Nowadays, it is sometimes necessary to detect low-energy electrons without post-acceleration. In such cases, extremely sensitive detectors are required that are able to detect even electrons with energies of only hundreds of eV while avoiding charging of the scintillator surface. However, commonly used scintillators strongly lose their light yield with the decrease of the incident electron energy. Moreover, a thinner conductive layer on the scintillator surface has to be used to allow low-energy electrons to pass through. Possible charging of the surface negatively affects its cathodoluminescence (CL) light yield. The low-energy electron excitation takes place closer to the scintillator surface where damage can be expected owing to its preparation, which also reduces the CL light yield. The aim was to study the influence of the scintillator and its conductive layer on the low-energy electron detection efficiency.
  • Cerium activated single crystals of yttrium aluminium garnet (YAG:Ce) Y3-xCexAl5O12 are widely used as scintillators in electron detectors for S(T)EM. Nowadays, it is sometimes necessary to detect low-energy electrons without post-acceleration. In such cases, extremely sensitive detectors are required that are able to detect even electrons with energies of only hundreds of eV while avoiding charging of the scintillator surface. However, commonly used scintillators strongly lose their light yield with the decrease of the incident electron energy. Moreover, a thinner conductive layer on the scintillator surface has to be used to allow low-energy electrons to pass through. Possible charging of the surface negatively affects its cathodoluminescence (CL) light yield. The low-energy electron excitation takes place closer to the scintillator surface where damage can be expected owing to its preparation, which also reduces the CL light yield. The aim was to study the influence of the scintillator and its conductive layer on the low-energy electron detection efficiency. (en)
Title
  • Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM
  • Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM (en)
skos:prefLabel
  • Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM
  • Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM (en)
skos:notation
  • RIV/68081731:_____/14:00434109!RIV15-TA0-68081731
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(EE.2.3.20.0103), P(TE01020118)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 36175
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/14:00434109
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • scintillator; YAG:Ce; single crystal; electron detector; SEM; STEM; low-energy electron; cathodoluminescence (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [753B33D2AEC4]
http://linked.open...v/mistoKonaniAkce
  • Praha
http://linked.open...i/riv/mistoVydani
  • Praha
http://linked.open...i/riv/nazevZdroje
  • 18th International Microscopy Congres. Proceedings
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Frank, Luděk
  • Bok, Jan
  • Schauer, Petr
  • Lalinský, Ondřej
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
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  • Czechoslovak Microscopy Society
https://schema.org/isbn
  • 978-80-260-6720-7
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