About: Innovation possibilities of scintillation electron detector for SEM

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	To evaluate performance of a scintillation detection system for SEM, it is necessary to consider many scintillator parameters. Various attributes of the scintillator for the SEM electron detector are listed in. The very important parameters are those affecting the detective quantum efficiency (DQE) which is primarily a measure of image noise. Not a less important indicator of image quality is the modulation transfer function (MTF) which describes the ability to show fine image details. Therefore, using a scanning imaging system, the detector bandwidth, which is given especially by the scintillator decay time, is the key to the good MTF. Currently, the YAG:Ce single crystal scintillator (introduced already in 1978 having somewhat limiting decay characteristic is the most frequently used scintillator in the SEM. The aim of this paper is to outline possibilities of scintillator innovation to get the improved MTF and DQE. To evaluate performance of a scintillation detection system for SEM, it is necessary to consider many scintillator parameters. Various attributes of the scintillator for the SEM electron detector are listed in. The very important parameters are those affecting the detective quantum efficiency (DQE) which is primarily a measure of image noise. Not a less important indicator of image quality is the modulation transfer function (MTF) which describes the ability to show fine image details. Therefore, using a scanning imaging system, the detector bandwidth, which is given especially by the scintillator decay time, is the key to the good MTF. Currently, the YAG:Ce single crystal scintillator (introduced already in 1978 having somewhat limiting decay characteristic is the most frequently used scintillator in the SEM. The aim of this paper is to outline possibilities of scintillator innovation to get the improved MTF and DQE. (en)
Title	Innovation possibilities of scintillation electron detector for SEM Innovation possibilities of scintillation electron detector for SEM (en)
skos:prefLabel	Innovation possibilities of scintillation electron detector for SEM Innovation possibilities of scintillation electron detector for SEM (en)
skos:notation	RIV/68081731:_____/14:00434107!RIV15-TA0-68081731
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(EE.2.3.20.0103), P(TE01020118)
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Bok, Jan Schauer, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	21929
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/14:00434107
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	electron detector; scintillator; cathodoluminescence; single crystal; SEM; DQE; MTF (en)
http://linked.open.../riv/klicoveSlovo	SEM DQE MTF electron detector cathodoluminescence scintillator single crystal
http://linked.open...ontrolniKodProRIV	[4A506BA2657F]
http://linked.open...v/mistoKonaniAkce	Praha
http://linked.open...i/riv/mistoVydani	Praha
http://linked.open...i/riv/nazevZdroje	18th International Microscopy Congres. Proceedings
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Support for human resources and transfer of knowledge in conditions of international cooperation of research teams Electron microscopy
http://linked.open...UplatneniVysledku	2014
http://linked.open...iv/tvurceVysledku	Bok, Jan Schauer, Petr
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2014-09-07 (xsd:date)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Czechoslovak Microscopy Society
https://schema.org/isbn	978-80-260-6720-7

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