About: Scanning Electron Microscopy With Slow Electrons

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Scanning low energy electron microscopy (SLEEM) with a catode lens provides improved image resolution at low energies, an enhanced signal of secondary electrons, a completely collected signal of backscattered electron (BSE) including very low energy electrons that are traditionally abandoned, and plenty of contrast mechnism not available with fast incident electrons. Scanning low energy electron microscopy (SLEEM) with a catode lens provides improved image resolution at low energies, an enhanced signal of secondary electrons, a completely collected signal of backscattered electron (BSE) including very low energy electrons that are traditionally abandoned, and plenty of contrast mechnism not available with fast incident electrons. (en)
Title	Scanning Electron Microscopy With Slow Electrons Scanning Electron Microscopy With Slow Electrons (en)
skos:prefLabel	Scanning Electron Microscopy With Slow Electrons Scanning Electron Microscopy With Slow Electrons (en)
skos:notation	RIV/68081731:_____/13:00398028!RIV14-TA0-68081731
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GAP108/11/2270), P(TE01020118)
http://linked.open...iv/cisloPeriodika	S2
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Müllerová, Ilona Mikmeková, Šárka Frank, Luděk Pokorná, Zuzana
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	104047
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/13:00398028
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Scanning Electron Microscopy; Slow Electrons; Grain Contrast; Contrast of the Density of States; Angle-resolved BSE (en)
http://linked.open.../riv/klicoveSlovo	Angle-resolved BSE Contrast of the Density of States Grain Contrast Slow Electrons Scanning Electron Microscopy
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[732524EA4BC1]
http://linked.open...i/riv/nazevZdroje	Microscopy and Microanalysis
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Mapping of the local crystallinic structure by backscattered electrons Electron microscopy
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	19
http://linked.open...iv/tvurceVysledku	Mikmeková, Šárka Müllerová, Ilona Frank, Luděk Pokorná, Zuzana
issn	1431-9276
number of pages	2 (xsd:int)

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